Refractive indices of lithium niobate as a function of wavelength and composition

1993 ◽  
Vol 73 (7) ◽  
pp. 3472-3476 ◽  
Author(s):  
U. Schlarb ◽  
K. Betzler
1976 ◽  
Vol 17 (3) ◽  
pp. 332-335 ◽  
Author(s):  
D.S. Smith ◽  
H.D. Riccius ◽  
R.P. Edwin

1998 ◽  
Vol 166 (1) ◽  
pp. R7-R8 ◽  
Author(s):  
K. Kasemir ◽  
K. Betzler ◽  
B. Matzas ◽  
B. Tiegel ◽  
M. Wöhlecke ◽  
...  

1989 ◽  
Vol 152 ◽  
Author(s):  
T. Bremer

ABSTRACTThe influence of ion beam induced lattice damage on the refractive indices is evaluated for He+ implanted planar waveguides in lithium niobate (LiNbO3) and potassium niobate (KNbO3 ). KNbO3 exhibits a higher sensitivity for ion beam induced refractive index alterations. In order to suppress leaky modes, varying angle implantation has been applied. The annealing of electronic damage in both crystals is compared. While it requires heating up to 200°C for LiNbO3, the electronic damage in KNbO3 has been found to anneal at much lower temperatures. Annealing takes place even at room temparature, the electronic damage vanishes almost completely within 100 days.


1996 ◽  
Vol 185 (1) ◽  
pp. 269-272 ◽  
Author(s):  
U. Schlarb ◽  
B. Matzas ◽  
A. Reichert ◽  
K. Betzler ◽  
M. Wöhlecke ◽  
...  

1974 ◽  
Vol 45 (8) ◽  
pp. 3688-3689 ◽  
Author(s):  
D. F. Nelson ◽  
R. M. Mikulyak

2008 ◽  
Vol 16 (1) ◽  
Author(s):  
P. Górski ◽  
R. Ledzion ◽  
K. Bondarczuk ◽  
W. Kucharczyk

AbstractA new method of determination of individual linear electrooptic coefficients is proposed. The technique is based on the dynamic polarimetric measurements and takes into consideration the temperature dependences of ordinary and extraordinary refractive indices. Results obtained for the electrooptic coefficients r113 and r333 in LiNbO3 are presented. The coefficients are found to increase significantly within the considered temperature range 25-200°C. The temperature dependences of the intrinsic coefficients m113 and m333, defined in terms of the induced polarisation, are considered as well.


1995 ◽  
Vol 4 (6) ◽  
pp. 791-795 ◽  
Author(s):  
U. Schlarb ◽  
M. Wöhlecke ◽  
B. Gather ◽  
A. Reichert ◽  
K. Betzler ◽  
...  

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