A novel scanning electron microscope method for the investigation of charge trapping in insulators

1994 ◽  
Vol 75 (1) ◽  
pp. 449-453 ◽  
Author(s):  
H. Gong ◽  
C. K. Ong
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Charge Trapping ◽  
Scanning Electron Microscope Method ◽  
Scanning Electron

Temperature effect on dielectric behavior of an industrial porcelain-type ceramic

2009 ◽  
Vol 87 (9) ◽  
pp. 973-980
Author(s):  
O. Hachicha ◽  
N. Ghorbel ◽  
A. Kallel ◽  
Z. Fakhfakh
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Charge Trapping ◽  
Dielectric Behavior ◽  
Mirror Image ◽  
Induced Current ◽  
Physical Mechanisms ◽  
Motion Process ◽  
Influence Of Temperature On ◽  
Scanning Electron

For a better understanding of the physical mechanisms involved in insulators submitted to electron irradiation inside a scanning electron microscope, it is important to investigate charge trapping and detrapping. The commonly used technique to deduce the trapping ability and the motion process of electric charges is based on two complementary experimental methods: the scanning electron microscope mirror effect (SEMME) and the induced current measurement (ICM). In this paper, our study is devoted to the influence of temperature on the behavior of porcelain materials during electron injection time. To evaluate the geometry of the trapped charge distribution, a detailed analysis using the mirror image formation and its evolution is developed.

scholarly journals A Comparative Study on the Corrosion Inhibition of Mild Steel and Aluminium by Synthesized Inhibitors in Organic Acidic Medium

2020 ◽  
pp. 41-51
Author(s):  
Lalita Saini ◽  
R. K. Upadhyay
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Mild Steel ◽  
Corrosion Inhibition ◽  
Acidic Medium ◽  
Trichloroacetic Acid ◽  
Inhibition Efficiency ◽  
Corrosion Inhibition Efficiency ◽  
Scanning Electron Microscope Method ◽  
Scanning Electron

Mass loss and Scanning Electron Microscope method (SEM) have been used to study the corrosion inhibition efficiency on mild steel and aluminium using synthesized inhibitors i.e. N-Benzylidene aniline (CI1) and N-Benzylidene 4-methylaniline (CI2) in Trichloroacetic acid (TCAA). Study reveals that both mild steel and aluminium are prone to corrosion in organic acid like TCAA. Out of these two metals, aluminium is more vigorously corroded by the TCAA in comparison to mild steel in same conditions and synthesized inhibitors CI1 and CI2 are almost same effective for mild steel and aluminium.

scholarly journals Microvasculature as Studied by the Microvascular Corrosion Casting/Scanning Electron Microscope Method

1983 ◽  
Vol 46 (1) ◽  
pp. 1-42 ◽  
Author(s):  
Osamu OHTANI ◽  
Akio KIKUTA ◽  
Aiji OHTSUKA ◽  
Takehito TAGUCHI ◽  
Takuro MURAKAMI
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Corrosion Casting ◽  
Scanning Electron Microscope Method ◽  
Scanning Electron

Microcharacterization of Induced Electric Fields in Poorly Conducting Specimens Irradiated in an Environmental Scanning Electron Microscope

2001 ◽  
Vol 7 (S2) ◽  
pp. 786-787
Author(s):  
Marion A. Stevens-Kalceff
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Electric Fields ◽  
High Vacuum ◽  
Charge Trapping ◽  
Environmental Scanning Electron Microscope ◽  
Variable Pressure ◽  
Environmental Scanning ◽  
Excess Charge ◽  
Scanning Electron

In a conventional scanning electron microscope, a thin, grounded conductive coating is applied to specimens that are poor electrical conductors to prevent retarding and deflection of the incident electron beam. in a variable pressure or environmental scanning electron microscope (ESEM), excess charge on the surface of uncoated poorly conducting specimens is balanced using ionized environmental gas. Ionized gas in environmental mode and grounded conductive coatings in conventional or high vacuum mode minimize charging at the specimen surface, however significant charge trapping may still occur in the implanted sub-surface regions of poorly conducting materials. A small fraction (<10-6) of the incident electrons are trapped at irradiation induced or pre-existing defects within the irradiated specimen. The trapped charge induces a highly localized electric field which can result in electro-migration and micro-segregation of charged mobile defect species within the irradiated micro-volume of specimen.

Comment and Reply on "Scanning electron microscope method for rock-varnish dating"

Geology ◽  
1988 ◽  
Vol 16 (11) ◽  
pp. 1051 ◽  
Author(s):  
Jennifer W. Harden ◽  
Marith C. Reheis ◽  
Janet M. Sowers ◽  
Janet L. Slate ◽  
C. D. Harrington ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Rock Varnish ◽  
Scanning Electron Microscope Method ◽  
Scanning Electron
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