Resistive measurement of the temperature dependence of the penetration depth of Nb in Nb/AlOx/Nb Josephson junctions

1994 ◽  
Vol 75 (12) ◽  
pp. 8163-8167 ◽  
Author(s):  
D. H. Kim ◽  
K. E. Gray ◽  
J. D. Hettinger ◽  
J. H. Kang ◽  
S. S. Choi
1991 ◽  
Vol 169 (1-4) ◽  
pp. 671-672 ◽  
Author(s):  
S.M. Anlage ◽  
B.W. Langley ◽  
G. Deutscher ◽  
R.W. Simon ◽  
J.M. Murduck ◽  
...  

1987 ◽  
Vol 36 (4) ◽  
pp. 2386-2389 ◽  
Author(s):  
D. R. Harshman ◽  
G. Aeppli ◽  
E. J. Ansaldo ◽  
B. Batlogg ◽  
J. H. Brewer ◽  
...  

1996 ◽  
Vol 53 (14) ◽  
pp. R8887-R8890 ◽  
Author(s):  
A. Yurgens ◽  
D. Winkler ◽  
N. V. Zavaritsky ◽  
T. Claeson

1990 ◽  
Vol 195 ◽  
Author(s):  
Steven M. Anlage ◽  
Brian W. Langley ◽  
Jurgen Halbritter ◽  
Chang-Beom Eom ◽  
Neil Switz ◽  
...  

ABSTRACTThe microstrip resonator technique has been applied to study the temperature dependence of the magnetic penetration depth in high quality YBa2Cu3O7−δ thin films. The temperature dependence at low temperatures comes out directly from measured data, with no assumptions about transmission line geometry, dielectric properties, or a model for the temperature dependence of the penetration depth. One can interpret the data in terms of either an exponential decay of λ(T) at low temperatures or as a power law decay. The energy gaps obtained from the exponential decay at low temperature are found to be significantly smaller than weak coupled BCS theory and power-law exponents are in the range of 1.3 to 3.2. These results will be discussed in terms of microscopic theories and the possibility that materials properties dominate the measurement.


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