Study of leakage current in n-channel and p-channel polycrystalline silicon thin-film transistors by conduction and low frequency noise measurements
2007 ◽
Vol 54
(5)
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pp. 1076-1082
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2009 ◽
Vol 48
(1)
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pp. 10303
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1996 ◽
Vol 51-52
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pp. 585-596
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1999 ◽
Vol 46
(5)
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pp. 968-974
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2003 ◽
Vol 427
(1-2)
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pp. 113-116
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