Study of the Drain Leakage Current in Bottom-Gated Nanocrystalline Silicon Thin-Film Transistors by Conduction and Low-Frequency Noise Measurements

2007 ◽  
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pp. 1076-1082 ◽  
Author(s):  
Argyrios T. Hatzopoulos ◽  
Nikolaos Arpatzanis ◽  
Dimitrios H. Tassis ◽  
Charalabos A. Dimitriadis ◽  
Maher Oudwan ◽  
...  
2009 ◽  
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pp. 124504 ◽  
Author(s):  
S. L. Rumyantsev ◽  
Sung Hun Jin ◽  
M. S. Shur ◽  
Mun-Soo Park

2012 ◽  
Vol 33 (4) ◽  
pp. 555-557 ◽  
Author(s):  
Andreas Tsormpatzoglou ◽  
Nikolaos A. Hastas ◽  
Shahrukh Khan ◽  
Miltiadis Hatalis ◽  
Charalabos A. Dimitriadis

1999 ◽  
Vol 46 (5) ◽  
pp. 968-974 ◽  
Author(s):  
C.T. Angelis ◽  
C.A. Dimitriadis ◽  
J. Brini ◽  
G. Kamarinos ◽  
V.K. Gueorguiev ◽  
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2000 ◽  
Vol 76 (22) ◽  
pp. 3268-3270 ◽  
Author(s):  
S. Giovannini ◽  
A. Bove ◽  
A. Valletta ◽  
L. Mariucci ◽  
A. Pecora ◽  
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1998 ◽  
Vol 83 (3) ◽  
pp. 1469-1475 ◽  
Author(s):  
C. A. Dimitriadis ◽  
J. Brini ◽  
G. Kamarinos ◽  
V. K. Gueorguiev ◽  
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