Study of the Drain Leakage Current in Bottom-Gated Nanocrystalline Silicon Thin-Film Transistors by Conduction and Low-Frequency Noise Measurements
2007 ◽
Vol 54
(5)
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pp. 1076-1082
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2009 ◽
Vol 48
(1)
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pp. 10303
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2012 ◽
Vol 33
(4)
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pp. 555-557
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1996 ◽
Vol 51-52
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pp. 585-596
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1999 ◽
Vol 46
(5)
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pp. 968-974
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