On the ionization potential of small metal and dielectric particles

1988 ◽  
Vol 88 (8) ◽  
pp. 5076-5085 ◽  
Author(s):  
Guy Makov ◽  
Abraham Nitzan ◽  
Louis E. Brus
Author(s):  
J. J. Kelsch ◽  
A. Holtz

A simple solution to the serious problem of specimen contamination in the electron microscope is presented. This is accomplished by the introduction of clean helium into the vacuum exactly at the specimen position. The local pressure gradient thus established inhibits the migration of hydrocarbon molecules to the specimen surface. The high ionization potential of He permits the use of relatively large volumes of the gas, without interfering with gun stability. The contamination rate is reduced on metal samples by a factor of 10.


2019 ◽  
Author(s):  
A Jenei ◽  
S Jiang ◽  
Y Ping ◽  
M Gorman ◽  
S Elatresh ◽  
...  

JETP Letters ◽  
2019 ◽  
Vol 110 (12) ◽  
pp. 761-765
Author(s):  
B. B. Zelener ◽  
S. A. Saakyan ◽  
V. A. Sautenkov ◽  
E. V. Vilshanskaya ◽  
B. V. Zelener ◽  
...  

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