Strain mapping at the nanoscale using precession electron diffraction in transmission electron microscope with off axis camera

Applied Physics Letters ◽

10.1063/1.4901435 ◽

2014 ◽

Vol 105 (19) ◽

pp. 191906 ◽

Author(s):

M. P. Vigouroux ◽

V. Delaye ◽

N. Bernier ◽

R. Cipro ◽

D. Lafond ◽

...

Keyword(s):

Electron Microscope ◽

Electron Diffraction ◽

Transmission Electron Microscope ◽

Strain Mapping ◽

Transmission Electron ◽

Precession Electron Diffraction

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Combining 2 nm Spatial Resolution and 0.02% Precision for Deformation Mapping of Semiconductor Specimens in a Transmission Electron Microscope by Precession Electron Diffraction

Nano Letters ◽

10.1021/acs.nanolett.5b01614 ◽

2015 ◽

Vol 15 (8) ◽

pp. 5289-5294 ◽

Author(s):

David Cooper ◽

Nicolas Bernier ◽

Jean-Luc Rouvière

Keyword(s):

Electron Microscope ◽

Electron Diffraction ◽

Spatial Resolution ◽

Transmission Electron Microscope ◽

Transmission Electron ◽

Precession Electron Diffraction

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Application of Scanning Precession Electron Diffraction in the Transmission Electron Microscope to the Characterization of Deformation in Wadsleyite and Ringwoodite

Minerals ◽

10.3390/min8040153 ◽

2018 ◽

Vol 8 (4) ◽

pp. 153 ◽

Author(s):

Billy Nzogang ◽

Simon Thilliez ◽

Alexandre Mussi ◽

Takaaki Kawazoe ◽

Nobuyoshi Miyajima ◽

...

Keyword(s):

Electron Microscope ◽

Electron Diffraction ◽

Transmission Electron Microscope ◽

Transmission Electron ◽

Precession Electron Diffraction

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High precision two-dimensional strain mapping in semiconductor devices using nanobeam electron diffraction in the transmission electron microscope

Applied Physics Letters ◽

10.1063/1.4886137 ◽

2014 ◽

Vol 104 (26) ◽

pp. 262102 ◽

Author(s):

Frieder H. Baumann

Keyword(s):

Electron Microscope ◽

Electron Diffraction ◽

High Precision ◽

Transmission Electron Microscope ◽

Semiconductor Devices ◽

Two Dimensional ◽

Strain Mapping ◽

Transmission Electron

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Precession electron diffraction & automated crystallite orientation/phase mapping in a transmission electron microscope

2011 11th IEEE International Conference on Nanotechnology ◽

10.1109/nano.2011.6144300 ◽

2011 ◽

Author(s):

Peter Moeck ◽

Sergei Rouvimov ◽

Ines Hausler ◽

Wolfgang Neumann ◽

Stavros Nicolopoulos

Keyword(s):

Electron Microscope ◽

Electron Diffraction ◽

Transmission Electron Microscope ◽

Crystallite Orientation ◽

Transmission Electron ◽

Precession Electron Diffraction ◽

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Automated nanocrystal orientation and phase mapping in the transmission electron microscope on the basis of precession electron diffraction

Zeitschrift für Kristallographie ◽

10.1524/zkri.2010.1205 ◽

2010 ◽

Vol 225 (2-3) ◽

Author(s):

Edgar F. Rauch ◽

Joaquin Portillo ◽

Stavros Nicolopoulos ◽

Daniel Bultreys ◽

Sergei Rouvimov ◽

...

Keyword(s):

Electron Microscope ◽

Electron Diffraction ◽

Transmission Electron Microscope ◽

Transmission Electron ◽

Precession Electron Diffraction ◽

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Precession electron diffraction and its utility for structural fingerprinting in the transmission electron microscope

10.1063/1.3251238 ◽

2009 ◽

Author(s):

Peter Moeck ◽

Sergei Rouvimov ◽

Stavros Nicolopoulos ◽

Erik M. Secula ◽

David G. Seiler ◽

...

Keyword(s):

Electron Microscope ◽

Electron Diffraction ◽

Transmission Electron Microscope ◽

Transmission Electron ◽

Precession Electron Diffraction

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Precession electron diffraction and its advantages for structural fingerprinting in the transmission electron microscope

Zeitschrift für Kristallographie ◽

10.1524/zkri.2010.1162 ◽

2010 ◽

Vol 225 (2-3) ◽

Author(s):

Peter Moeck ◽

Sergei Rouvimov

Keyword(s):

Electron Microscope ◽

Electron Diffraction ◽

Transmission Electron Microscope ◽

Transmission Electron ◽

Precession Electron Diffraction

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Field mapping of semiconductor devices in a transmission electron microscope with nanometre scale resolution by off-axis electron holography and precession electron diffraction

2015 IEEE 15th International Conference on Nanotechnology (IEEE-NANO) ◽

10.1109/nano.2015.7388725 ◽

2015 ◽

Author(s):

David Cooper ◽

Nicolas Bernier ◽

Jean-Luc Rouviere

Keyword(s):

Electron Microscope ◽

Electron Diffraction ◽

Transmission Electron Microscope ◽

Semiconductor Devices ◽

Electron Holography ◽

Field Mapping ◽

Transmission Electron ◽

Precession Electron Diffraction

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Microbeam analysis. Analytical electron microscopy. Selected-area electron diffraction analysis using a transmission electron microscope

10.3403/30157805u ◽

2015 ◽

Keyword(s):

Electron Microscopy ◽

Electron Microscope ◽

Electron Diffraction ◽

Diffraction Analysis ◽

Transmission Electron Microscope ◽

Analytical Electron Microscopy ◽

Electron Diffraction Analysis ◽

Selected Area Electron Diffraction ◽

Transmission Electron ◽

Analytical Electron

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Microbeam analysis. Analytical electron microscopy. Selected-area electron diffraction analysis using a transmission electron microscope

10.3403/30157805 ◽

2010 ◽

Keyword(s):

Electron Microscopy ◽

Electron Microscope ◽

Electron Diffraction ◽

Diffraction Analysis ◽

Transmission Electron Microscope ◽

Analytical Electron Microscopy ◽

Electron Diffraction Analysis ◽

Selected Area Electron Diffraction ◽

Transmission Electron ◽

Analytical Electron

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