Secondary resonance magnetic force microscopy using an external magnetic field for characterization of magnetic thin films

2015 ◽  
Vol 107 (10) ◽  
pp. 103110 ◽  
Author(s):  
Dongzi Liu ◽  
Kangxin Mo ◽  
Xidong Ding ◽  
Liangbing Zhao ◽  
Guocong Lin ◽  
...  
Keyword(s):  
Magnetic Field ◽  
Thin Films ◽  
External Magnetic Field ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Magnetic Thin Films ◽  
Secondary Resonance ◽  
Force Microscopy

Study of MFM Application in Semiconductor Failure Analysis

2004 ◽  
Author(s):  
Way-Jam Chen ◽  
Lily Shiau ◽  
Ming-Ching Huang ◽  
Chia-Hsing Chao
Keyword(s):  
Magnetic Field ◽  
Failure Analysis ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Current Flow ◽  
Force Microscopy ◽  
The Magnetic Field ◽  
A Current

Abstract In this study we have investigated the magnetic field associated with a current flowing in a circuit using Magnetic Force Microscopy (MFM). The technique is able to identify the magnetic field associated with a current flow and has potential for failure analysis.

Different types of ferrite thin films as magnetic cantilever coating for magnetic force microscopy

2010 ◽  
Vol 322 (9-12) ◽  
pp. 1697-1699 ◽  
Author(s):  
M.R. Koblischka ◽  
M. Kirsch ◽  
R. Pfeifer ◽  
S. Getlawi ◽  
F. Rigato ◽  
...  
Keyword(s):  
Thin Films ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Force Microscopy ◽  
Different Types ◽  
Ferrite Thin Films

Characterization of magnetic force microscopy probe tip remagnetization for measurements in external in-plane magnetic fields

2008 ◽  
Vol 104 (12) ◽  
pp. 123503 ◽  
Author(s):  
Tanja Weis ◽  
Ingo Krug ◽  
Dieter Engel ◽  
Arno Ehresmann ◽  
Volker Höink ◽  
...  
Keyword(s):  
Magnetic Fields ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Force Microscopy
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