scholarly journals Advanced Magnetic Force Microscopy Tips for Domain Images of Soft Magnetic Materials under Magnetic Field

2002 ◽  
Vol 8 (S02) ◽  
pp. 378-379
Author(s):  
S. H. Liou
1996 ◽  
Vol 157-158 ◽  
pp. 555-556 ◽  
Author(s):  
M.S. Valera ◽  
S.L. Tomlinson ◽  
G.P. Heydon ◽  
A.N. Farley ◽  
S.R. Hoon ◽  
...  

1999 ◽  
Vol 577 ◽  
Author(s):  
M. E. Hawley ◽  
G. W. Brown ◽  
D. J. Thoma ◽  
M. A. Willard ◽  
D. E. Laughlin ◽  
...  

ABSTRACTNew nanocrystalline, multicomponent extremely soft magnetic materials with superior high temperature magnetic properties hold great promise in power applications. Fabricated in ribbon form by rapid solidification methods, the initial material is amorphous. By controlled annealing procedures, the amorphous material was transformed into a nanocrystalline form with the degree of crystallinity determined by the annealing temperature and time. The magnetic structures of ribbons, as-fabricated and annealed at temperatures from 550 to 750 °C were examined by magnetic force microscopy to determine the impact of residual stress and nanocrystallinity on the observed structure. A correlation was seen between the magnetic structures and surface microstructure. The wheel side of the as-processed ribbon was rougher than the top side of the ribbon and a complicated magnetic domain structure was present in the amorphous material. After annealing, nanocrystals formed, increasing in size with increasing temperature. The lowest temperature annealed sample had a bimodal grain size distribution and a combination of stripe and localized domains. After annealing little difference was seen between the two sides of the ribbons. Stripe domains were absent in the ribbons annealed at the highest temperatures.


Author(s):  
Way-Jam Chen ◽  
Lily Shiau ◽  
Ming-Ching Huang ◽  
Chia-Hsing Chao

Abstract In this study we have investigated the magnetic field associated with a current flowing in a circuit using Magnetic Force Microscopy (MFM). The technique is able to identify the magnetic field associated with a current flow and has potential for failure analysis.


2020 ◽  
Vol 500 ◽  
pp. 166296
Author(s):  
Ibrahim Cinar ◽  
Daniel Lacour ◽  
Francois Montaigne ◽  
Vito Puliafito ◽  
Sebastien Petit Watelot ◽  
...  

2020 ◽  
Vol 511 ◽  
pp. 166947
Author(s):  
Xiukun Hu ◽  
Gaoliang Dai ◽  
Sibylle Sievers ◽  
Alexander Fernández-Scarioni ◽  
Héctor Corte-León ◽  
...  

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