Operando x-ray photoelectron emission microscopy for studying forward and reverse biased silicon p-n junctions

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Vol 87 (5) ◽  
pp. 053703 ◽  
Author(s):  
N. Barrett ◽  
D. M. Gottlob ◽  
C. Mathieu ◽  
C. Lubin ◽  
J. Passicousset ◽  
...  
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pp. 13-18 ◽  
Author(s):  
L. Gregoratti ◽  
T.O. Mentes ◽  
A. Locatelli ◽  
M. Kiskinova

2011 ◽  
Vol 55 (4) ◽  
pp. 13:1-13:5 ◽  
Author(s):  
M. Kotsugi ◽  
T. Wakita ◽  
T. Taniuchi ◽  
H. Maruyama ◽  
C. Mitsumata ◽  
...  

2000 ◽  
Vol 71 (1) ◽  
pp. 11-14 ◽  
Author(s):  
Gelsomina De Stasio ◽  
B. Gilbert ◽  
T. Nelson ◽  
R. Hansen ◽  
J. Wallace ◽  
...  

RSC Advances ◽  
2021 ◽  
Vol 11 (16) ◽  
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Author(s):  
Jan Dreiser ◽  
Christian Wäckerlin ◽  
Michele Buzzi ◽  
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The island formation of Er(trensal) single-ion molecular magnets on graphene/Ru(0001) has been studied using X-ray photoelectron emission microscopy.


2010 ◽  
Author(s):  
Y. Kotani ◽  
T. Taniuchi ◽  
M. Osada ◽  
T. Sasaki ◽  
M. Kotsugi ◽  
...  

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pp. 6533-6536 ◽  
Author(s):  
J. Vogel ◽  
W. Kuch ◽  
J. Camarero ◽  
K. Fukumoto ◽  
Y. Pennec ◽  
...  

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Vol 162 (3) ◽  
pp. 107-114 ◽  
Author(s):  
Stephen Christensen ◽  
Uday D. Lanke ◽  
Brian Haines ◽  
Shatha E. Qaqish ◽  
Matthew F. Paige ◽  
...  

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