Localized surface plasmon polariton resonance in holographically structured Al-doped ZnO

2016 ◽  
Vol 120 (4) ◽  
pp. 043109 ◽  
Author(s):  
David George ◽  
Li Li ◽  
Yan Jiang ◽  
David Lowell ◽  
Michelle Mao ◽  
...  
Materials ◽  
2021 ◽  
Vol 14 (23) ◽  
pp. 7292
Author(s):  
Tomasz Rerek ◽  
Beata Derkowska-Zielinska ◽  
Marek Trzcinski ◽  
Robert Szczesny ◽  
Mieczyslaw K. Naparty ◽  
...  

Copper layers with thicknesses of 12, 25, and 35 nm were thermally evaporated on silicon substrates (Si(100)) with two different deposition rates 0.5 and 5.0 Å/s. The microstructure of produced coatings was studied using atomic force microscopy (AFM) and powder X-ray diffractometer (XRD). Ellipsometric measurements were used to determine the effective dielectric functions <ε˜> as well as the quality indicators of the localized surface plasmon (LSP) and the surface plasmon polariton (SPP). The composition and purity of the produced films were analysed using X-ray photoelectron spectroscopy (XPS).


2008 ◽  
Vol 20 (13) ◽  
pp. 1103-1105 ◽  
Author(s):  
C. M. Wang ◽  
Y. C. Chang ◽  
M. W. Tsai ◽  
Y. H. Ye ◽  
C. Y. Chen ◽  
...  

2018 ◽  
Vol 26 (7) ◽  
pp. 9205 ◽  
Author(s):  
Yu-Feng Yao ◽  
Chun-Han Lin ◽  
Chen-Yao Chao ◽  
Wen-Yen Chang ◽  
Chia-Ying Su ◽  
...  

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