Stability, sub-gap current, 1/f-noise, and elemental depth profiling of annealed Al:Mn-AlOX-Al normal metal-insulator-superconducting tunnel junctions
2016 ◽
Vol 6
(12)
◽
pp. 125026
J. K. Julin
◽
S. Chaudhuri
◽
M. Laitinen
◽
T. Sajavaara
◽
I. J. Maasilta
I. P. Nevirkovets
◽
O. Chernyashevskyy
◽
J. B. Ketterson
1997 ◽
Vol 5
(7-12)
◽
pp. 227-233
◽
M.M. Leivo
◽
A.J. Manninen
◽
J.P. Pekola
2003 ◽
Vol 128
(8)
◽
pp. 315-319
◽
Xiaowei Li
◽
R. Shen
◽
D.Y. Xing
M. Fogelström
◽
D. Rainer
◽
J. A. Sauls
2005 ◽
Vol 54
(5)
◽
pp. 2313
2021 ◽
Vol 31
(5)
◽
pp. 1-4
Andrii Torgovkin
◽
Aki Ruhtinas
◽
Ilari J. Maasilta
2005 ◽
Vol 54
(5)
◽
pp. 2318
Wei Jian-Wen
◽
Dong Zheng-Chao
2011 ◽
Vol 167
(3-4)
◽
pp. 392-397
◽
Peter J. Lowell
◽
Galen C. O’Neil
◽
Jason M. Underwood
◽
Joel N. Ullom
2014 ◽
Vol 104
(12)
◽
pp. 122601
◽
S. Chaudhuri
◽
I. J. Maasilta
2007 ◽
Vol 20
(8)
◽
pp. 865-869
◽
Ernst Otto
◽
Mikhail Tarasov
◽
Leonid Kuzmin