scholarly journals High-throughput investigation of orientations effect on nanoscale magnetization reversal in cobalt ferrite thin films induced by electric field

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ACS Nano ◽  
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...  

1986 ◽  
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W.L. Peeters

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pp. 053914 ◽  
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D. Mukherjee ◽  
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P. Mukherjee ◽  
M. H. Phan ◽  
...  

2019 ◽  
Vol 484 ◽  
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Parviz Kameli ◽  
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Amir Sajad Esmaeily

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pp. 4135-4140 ◽  
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Lakshmikanta Aditya ◽  
A. Srivastava ◽  
S. K. Sahoo ◽  
P. Das ◽  
C. Mukherjee ◽  
...  

Cobalt ferrite thin films have been deposited on fused quartz substrates by pulsed laser deposition at various substrate temperatures, TS (25 °C, 300 °C, 550 °C and 750 °C). Single phase, nanocrystalline, spinel cobalt ferrite formation is confirmed by X-ray diffraction (XRD) for TS ≥ 300 °C. Conventional XRD studies reveal strong (111) texturing in the as deposited films with TS ≥ 550 °C. Bulk texture measurements using X-ray orientation distribution function confirmed (111) preferred orientation in the films with TS ≥ 550 °C. Grain size (13–16 nm for TS ≥ 300 °C) estimation using grazing incidence X-ray line broadening analysis shows insignificant grain growth with increasing TS, which is in good agreement with grain size data obtained from transmission electron microscopy.


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