Focus on analytical equipment, sensors, and detectors

Physics Today ◽  
2016 ◽  
Vol 69 (2) ◽  
pp. 55-58
Author(s):  
Andreas Mandelis
Keyword(s):  

Author(s):  
U. Gross ◽  
P. Hagemann

By addition of analytical equipment, scanning transmission accessories and data processing equipment the basic transmission electron microscope (TEM) has evolved into a comprehensive information gathering system. This extension has led to increased complexity of the instrument as compared with the straightforward imaging microscope, since in general new information capacity has required the addition of new control hardware. The increased operational complexity is reflected in a proliferation of knobs and buttons.In the conventional electron microscope design the operating panel of the instrument has distinct control elements to alter optical conditions of the microscope column in different modes. As a consequence a multiplicity of control functions has been inevitable. Examples of this are the three pairs of focus and magnification controls needed for TEM imaging, diffraction patterns, and STEM images.



2020 ◽  
pp. 234-240
Author(s):  
V.A. Levchenko ◽  
Yu.V. Panfilov

Tendency of strengthening coatings on cutting tools processes evolution is analyzed. Manifold of strengthening materials, strengthening coatings deposition methods, process and analytical equipment for coatings manufacture and measurement of it’s properties is described. International standards for strengthening coatings on cutting tools composition, structure and properties are presented.



Physics Today ◽  
2021 ◽  
Vol 74 (5) ◽  
pp. 56-60
Author(s):  
Andreas Mandelis
Keyword(s):  


Physics Today ◽  
2007 ◽  
Vol 60 (8) ◽  
pp. 66-68
Keyword(s):  


Nature ◽  
10.1038/34992 ◽  
1998 ◽  
Vol 391 (6666) ◽  
pp. 425-425
Author(s):  
Tony Reichardt
Keyword(s):  


1979 ◽  
pp. 857-875 ◽  
Author(s):  
C. E. Garrett ◽  
E. F. Good
Keyword(s):  


Analytics ◽  
2018 ◽  
pp. 114-116
Author(s):  
M.V. Tremasova ◽  
T.G. Borisova ◽  
V.N. Tsupreva
Keyword(s):  


1970 ◽  
Vol 42 (6) ◽  
pp. 40A-40A
Keyword(s):  


Author(s):  
Michael S. Hatzistergos

Characterization of an issue provides the required information to determine the root cause of a problem and direct the researcher towards the appropriate solution. Through the explosion of nanotechnology in the past few years, the use of sophisticated analytical equipment has become mandatory. There is no one analytical technique that can provide all the answers a researcher is looking for. Therefore, a large number of very different instruments exist, and knowing which one is best to employ for a specific problem is key to success.



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