Time-Resolved Crystallography at X-ray Free Electron Lasers and Synchrotron Light Sources

2015 ◽  
Vol 28 (6) ◽  
pp. 25-30 ◽  
Author(s):  
Marius Schmidt
2016 ◽  
Vol 23 (1) ◽  
pp. 141-151 ◽  
Author(s):  
A. G. Stepanov ◽  
C. P. Hauri

High-brightness X-ray radiation produced by third-generation synchrotron light sources (TGLS) has been used for numerous time-resolved investigations in many different scientific fields. The typical time duration of X-ray pulses delivered by these large-scale machines is about 50–100 ps. A growing number of time-resolved studies would benefit from X-ray pulses with two or three orders of magnitude shorter duration. Here, techniques explored in the past for shorter X-ray pulse emission at TGLS are reviewed and the perspective towards the realisation of picosecond and sub-picosecond X-ray pulses are discussed.


2022 ◽  
Vol 29 (1) ◽  
Author(s):  
XianRong Huang ◽  
Xianbo Shi ◽  
Lahsen Assoufid

Rigorous dynamical theory calculations show that four-beam diffraction (4BD) can be activated only by a unique photon energy and a unique incidence direction. Thus, 4BD may be used to precisely calibrate X-ray photon energies and beam positions. Based on the principles that the forbidden-reflection 4BD pattern, which is typically an X-shaped cross, can be generated by instant imaging using the divergent beam from a point source without rocking the crystal, a detailed real-time high-resolution beam (and source) position monitoring scheme is illustrated for monitoring two-dimensional beam positions and directions of modern synchrotron light sources, X-ray free-electron lasers and nano-focused X-ray sources.


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