scholarly journals X-ray beam monitoring and wavelength calibration using four-beam diffraction

2022 ◽  
Vol 29 (1) ◽  
Author(s):  
XianRong Huang ◽  
Xianbo Shi ◽  
Lahsen Assoufid
Keyword(s):  
Dynamical Theory ◽  
Light Sources ◽  
Free Electron Lasers ◽  
Divergent Beam ◽  
X Ray ◽  
Synchrotron Light ◽  
Synchrotron Light Sources ◽  
Beam Monitoring ◽  
Position Monitoring ◽  
Beam Diffraction

Rigorous dynamical theory calculations show that four-beam diffraction (4BD) can be activated only by a unique photon energy and a unique incidence direction. Thus, 4BD may be used to precisely calibrate X-ray photon energies and beam positions. Based on the principles that the forbidden-reflection 4BD pattern, which is typically an X-shaped cross, can be generated by instant imaging using the divergent beam from a point source without rocking the crystal, a detailed real-time high-resolution beam (and source) position monitoring scheme is illustrated for monitoring two-dimensional beam positions and directions of modern synchrotron light sources, X-ray free-electron lasers and nano-focused X-ray sources.

scholarly journals Short X-ray pulses from third-generation light sources

2016 ◽  
Vol 23 (1) ◽  
pp. 141-151 ◽  
Author(s):  
A. G. Stepanov ◽  
C. P. Hauri
Keyword(s):  
Large Scale ◽  
Light Sources ◽  
Third Generation ◽  
Time Duration ◽  
Pulse Emission ◽  
Time Resolved ◽  
High Brightness ◽  
X Ray ◽  
Synchrotron Light ◽  
Synchrotron Light Sources

High-brightness X-ray radiation produced by third-generation synchrotron light sources (TGLS) has been used for numerous time-resolved investigations in many different scientific fields. The typical time duration of X-ray pulses delivered by these large-scale machines is about 50–100 ps. A growing number of time-resolved studies would benefit from X-ray pulses with two or three orders of magnitude shorter duration. Here, techniques explored in the past for shorter X-ray pulse emission at TGLS are reviewed and the perspective towards the realisation of picosecond and sub-picosecond X-ray pulses are discussed.

scholarly journals A Rebirth of Laboratory XANES and XES

2014 ◽  
Vol 70 (a1) ◽  
pp. C222-C222
Author(s):  
Gerald Seidler ◽  
Devon Mortensen ◽  
Joseph Pacold ◽  
Oliver Hoidn
Keyword(s):  
High Resolution ◽  
Energy Range ◽  
Emission Spectroscopy ◽  
Light Sources ◽  
Edge Structure ◽  
X Ray ◽  
Insertion Device ◽  
Synchrotron Light ◽  
Synchrotron Light Sources ◽  
X Ray Absorption

We have recently launched a reinvestigation of laboratory-based measurement of x-ray absorption near edge structure (XANES) and high-resolution x-ray emission spectroscopy (XES). Driven by the roughly one-hundred-fold improvement in the efficiency of high resolution x-ray optics compared to the 1970's, we have demonstrated that surprisingly impressive performance is now possible with laboratory XES instruments and that quite useful performance is possible for laboratory XANES. For applications in the 5 keV- 10 keV energy range, i.e., appropriate for 3d transition metal K edges and lanthanide L edges, we find XES performance that is intermediate between what can be achieved at bending-magnet and insertion-device beamlines at third generation synchrotron light sources. In the same energy range, we find that high quality XANES measurements can be performed in transmission mode on concentrated samples with the present instrument and should be possible, in many cases, in fluorescence mode after a planned upgrade brings the monochromatic beam flux up to approximately 10M/sec.

A monochromator for scanning X-ray microscopy beamlines at third-generation synchrotron light sources

1996 ◽  
Vol 3 (4) ◽  
pp. 197-198 ◽  
Author(s):  
A. Irtel von Brenndorff ◽  
B. Niemann ◽  
D. Rudolph ◽  
G. Schmahl
Keyword(s):  
Light Sources ◽  
Third Generation ◽  
X Ray ◽  
Synchrotron Light ◽  
Synchrotron Light Sources
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