Data Analysis Environment for X-ray Free-Electron Laser Experiments at SACLA

2017 ◽  
Vol 30 (1) ◽  
pp. 16-21 ◽  
Author(s):  
Yasumasa Joti ◽  
Kyo Nakajima ◽  
Takashi Kameshima ◽  
Mitsuhiro Yamaga ◽  
Toshinori Abe ◽  
...  
2015 ◽  
Vol 22 (3) ◽  
pp. 571-576 ◽  
Author(s):  
Yasumasa Joti ◽  
Takashi Kameshima ◽  
Mitsuhiro Yamaga ◽  
Takashi Sugimoto ◽  
Kensuke Okada ◽  
...  

A data acquisition system for X-ray free-electron laser experiments at SACLA has been developed. The system has been designed for reliable shot-to-shot data storage with a high data stream greater than 4 Gbps and massive data analysis. Configuration of the system and examples of prompt data analysis during experiments are presented. Upgrade plans for the system to extend flexibility are described.


Optica ◽  
2020 ◽  
Vol 7 (8) ◽  
pp. 1007 ◽  
Author(s):  
Florian Döring ◽  
Benedikt Rösner ◽  
Manuel Langer ◽  
Adam Kubec ◽  
Armin Kleibert ◽  
...  

2016 ◽  
Vol 49 (3) ◽  
pp. 1073-1080 ◽  
Author(s):  
Valerio Mariani ◽  
Andrew Morgan ◽  
Chun Hong Yoon ◽  
Thomas J. Lane ◽  
Thomas A. White ◽  
...  

This article describes a free and open-source data analysis utility designed for fast online feedback during serial X-ray diffraction and scattering experiments:OnDA(online data analysis). Three complete real-time monitors for common types of serial X-ray imaging experiments are presented. These monitors are capable of providing the essential information required for quick decision making in the face of extreme rates of data collection. In addition, a set of modules, functions and algorithms that allow developers to modify the provided monitors or develop new ones are provided. The emphasis here is on simple, modular and scalable code that is based on open-source libraries and protocols.OnDAmonitors have already proven to be invaluable tools in several experiments, especially for scoring and monitoring of diffraction data during serial crystallography experiments at both free-electron laser and synchrotron facilities. It is felt that in the future the kind of fast feedback thatOnDAmonitors provide will help researchers to deal with the expected very high throughput data flow at next-generation facilities such as the European X-ray free-electron laser.


2014 ◽  
Vol 85 (3) ◽  
pp. 033110 ◽  
Author(s):  
Takashi Kameshima ◽  
Shun Ono ◽  
Togo Kudo ◽  
Kyosuke Ozaki ◽  
Yoichi Kirihara ◽  
...  

2010 ◽  
Vol 81 (10) ◽  
pp. 10E330
Author(s):  
J. Dunn ◽  
R. A. London ◽  
K. V. Cone ◽  
J. J. Rocca ◽  
N. Rohringer

Author(s):  
Choji Saji ◽  
Toru Ohata ◽  
Toshinori Abe ◽  
Ryotaro Tanaka ◽  
Mitsuhiro Yamaga ◽  
...  

2011 ◽  
Vol 17 (S2) ◽  
pp. 910-911
Author(s):  
H Soltau ◽  
R Hartmann ◽  
A Hartmann ◽  
P Holl ◽  
S Ihle ◽  
...  

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.


2016 ◽  
Vol 49 (3) ◽  
pp. 1065-1072 ◽  
Author(s):  
Helen Mary Ginn ◽  
Gwyndaf Evans ◽  
Nicholas K. Sauter ◽  
David Ian Stuart

As serial femtosecond crystallography expands towards a variety of delivery methods, including chip-based methods, and smaller collected data sets, the requirement to optimize the data analysis to produce maximum structure quality is becoming increasingly pressing. Herecppxfel, a software package primarily written in C++, which showcases several data analysis techniques, is released. This software package presently indexes images using DIALS (diffraction integration for advanced light sources) and performs an initial orientation matrix refinement, followed by post-refinement of individual images against a reference data set.Cppxfelis released with the hope that the unique and useful elements of this package can be repurposed for existing software packages. However, as released, it produces high-quality crystal structures and is therefore likely to be also useful to experienced users of X-ray free-electron laser (XFEL) software who wish to maximize the information extracted from a limited number of XFEL images.


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