Applicability of the multi-hit model to calculate the track etch rate in µm-scale in CR-39 detectors

2003 ◽  
Vol 158 (7) ◽  
pp. 539-550 ◽  
Author(s):  
E. M. Awad
2002 ◽  
Vol 35 (3) ◽  
pp. 177-182 ◽  
Author(s):  
B. Dörschel ◽  
D. Hermsdorf ◽  
K. Kadner ◽  
S. Starke

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