Small phase differences in holographic interferometry

1970 ◽  
Vol 1 (2) ◽  
pp. 7-7
Author(s):  
C H F Velzel
1981 ◽  
Vol 52 (11) ◽  
pp. 1776-1777 ◽  
Author(s):  
F. Schauer

2021 ◽  
Vol 129 (2) ◽  
pp. 174
Author(s):  
Г.Б. Малыкин

Methods of interferometry, which are used to measure very small phase differences, are considered. in fundamental and applied problems. It is shown that the first improvements in interferometric methods for measuring small phase differences for recording various physical phenomena in the second half of the XIX - early XX centuries. carried out by I.A. Fizeau, A.A. Michelson, E. Morley, Lord Rayleigh, D.C. Miller and J.M. Sagnac. It was also shown that the most sensitive method of modulation interferometry was created in the period 1949-1952. Soviet radiophysicists A.A. Andronov, I.L. Berstein and G.S. Gorelik. It is noted that the modulation interferometry method could be implemented even in 1914 with a photocell on an external photoelectric effect, or in 1923 with a photocell on internal photoelectric effect (photodiode). However, then professional opticians used traditional methods for measuring small phase differences, and radiophysics as a science was just beginning its formation. It is shown that the methods of electrical and photoelectric harmonic analysis developed in late XIX - early XX centuries could find successful application in interferometry, but by that time, when they could find practical use, they were almost completely forgotten.


Author(s):  
Rob. W. Glaisher ◽  
A.E.C. Spargo

Images of <11> oriented crystals with diamond structure (i.e. C,Si,Ge) are dominated by white spot contrast which, depending on thickness and defocus, can correspond to either atom-pair columns or tunnel sites. Olsen and Spence have demonstrated a method for identifying the correspondence which involves the assumed structure of a stacking fault and the preservation of point-group symmetries by correctly aligned and stigmated images. For an intrinsic stacking fault, a two-fold axis lies on a row of atoms (not tunnels) and the contrast (black/white) of the atoms is that of the {111} fringe containing the two-fold axis. The breakdown of Friedel's law renders this technique unsuitable for the related, but non-centrosymmetric binary compound sphalerite materials (e.g. GaAs, InP, CdTe). Under dynamical scattering conditions, Bijvoet related reflections (e.g. (111)/(111)) rapidly acquire relative phase differences deviating markedly from thin-crystal (kinematic) values, which alter the apparent location of the symmetry elements needed to identify the defect.


Author(s):  
Walter Schumann ◽  
Michel Dubas

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