Response of machining-damaged single-crystalline silicon wafers to nanosecond pulsed laser irradiation

2007 ◽  
Vol 22 (4) ◽  
pp. 392-395 ◽  
Author(s):  
Jiwang Yan ◽  
Tooru Asami ◽  
Tsunemoto Kuriyagawa
2013 ◽  
Vol 58 (2) ◽  
pp. 142-150 ◽  
Author(s):  
A.V. Sachenko ◽  
◽  
V.P. Kostylev ◽  
V.G. Litovchenko ◽  
V.G. Popov ◽  
...  

2014 ◽  
Vol 38 (4) ◽  
pp. 157-161 ◽  
Author(s):  
H. Kaiju ◽  
Y. Yoshida ◽  
S. Watanabe ◽  
K. Kondo ◽  
A. Ishibashi ◽  
...  

2015 ◽  
Vol 2015 ◽  
pp. 1-8 ◽  
Author(s):  
Ryosuke Watanabe ◽  
Yohei Eguchi ◽  
Takuya Yamada ◽  
Yoji Saito

Antireflection coating (ARC) prepared by a wet process is beneficial for low cost fabrication of photovoltaic cells. In this study, we investigated optical properties and morphologies of spin-coated TiO2ARCs on alkaline textured single-crystalline silicon wafers. Reflectance spectra of the spin-coated ARCs on alkaline textured silicon wafers exhibit no interferences and low reflectance values in the entire visible range. We modeled the structures of the spin-coated films for ray tracing numerical calculation and compared numerically calculated reflectance spectra with the experimental results. This is the first report to clarify the novel optical properties experimentally and theoretically. Optical properties of the spin-coated ARCs without interference are due to the fractional nonuniformity of the thickness of the spin-coated ARCs that cancels out the interference of the incident light.


2014 ◽  
Vol 248 ◽  
pp. 38-45 ◽  
Author(s):  
D.P. Adams ◽  
R.D. Murphy ◽  
D.J. Saiz ◽  
D.A. Hirschfeld ◽  
M.A. Rodriguez ◽  
...  

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