Mueller matrix representation for a slab of random medium with discrete particles and random rough surfaces with moderate surface roughness

1993 ◽  
Vol 3 (2) ◽  
pp. 111-125 ◽  
Author(s):  
Chi M Lam ◽  
Akira Ishimaru
1985 ◽  
Vol 54 ◽  
Author(s):  
J. R. Blanco ◽  
K. Vedam ◽  
P. J. McMarr ◽  
J. M. Bennett

ABSTRACTWell characterized rough surfaces of aluminum films have been studied by the nondestructive technique of Spectroscopie Ellipsometry (SE). The roughness of the aluminum specimens had been characterized earlier by Total Integrated Scattering and Stylus Profilometry techniques to obtain numerical estimates of ras roughness and autocovariance lengths. The present SE measurements on these specimens were carried out at a number of angles of incidence in the range 30–80° and at a number of discrete wavelengths in the spectral range 300–650nm. The SE results were then analyzed by the scalar theory of diffraction from random rough surfaces by treating the surface as a simple random rough surface. The results of such analyses of the SE measurements are compared with the results of the earlier characterization techniques.


1995 ◽  
Vol 10 (8) ◽  
pp. 1984-1992 ◽  
Author(s):  
X.B. Zhou ◽  
J.Th.M. De Hosson

A this paper the influence of surface roughness on contact angles in the system of liquid Al wetting solid surfaces of Al2O3 has been studied. It was observed that contact angles of liquid Al vary significantly on different rough surfaces of Al2O3. A model is proposed to correlate contact angles with conventional roughness measurements and wavelengths by assuming a cosine profile of rough grooves with a Gaussian distribution of amplitudes. In comparison with the experimental results, the model provides a good estimate for describing the influence of surface roughness on contact angles of liquid Al on Al2O3.


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