Fatigue characteristics of polycrystalline silicon thin-film membrane and its dependence on humidity

2013 ◽  
Vol 23 (3) ◽  
pp. 035032 ◽  
Author(s):  
Tomoki Tanemura ◽  
Shuichi Yamashita ◽  
Hiroyuki Wado ◽  
Yukihiro Takeuchi ◽  
Toshiyuki Tsuchiya ◽  
...  
Keyword(s):  
Thin Film ◽  
Polycrystalline Silicon ◽  
Silicon Thin Film ◽  
Fatigue Characteristics ◽  
Thin Film Membrane

Out-of-plane Bending Vibration Fracture Test of Polycrystalline Silicon Thin-film Membrane

2012 ◽  
Vol 132 (7) ◽  
pp. 224-229 ◽  
Author(s):  
Tomoki Tanemura ◽  
Shuichi Yamashita ◽  
Hiroyuki Wado ◽  
Yukihiro Takeuchi ◽  
Toshiyuki Tsuchiya ◽  
...  
Keyword(s):  
Thin Film ◽  
Polycrystalline Silicon ◽  
Fracture Test ◽  
Silicon Thin Film ◽  
Bending Vibration ◽  
Out Of Plane ◽  
Plane Bending ◽  
Thin Film Membrane

Fatigue Testing of Polycrystalline Silicon Thin-Film Membrane Using Out-of-Plane Bending Vibration

2012 ◽  
Vol 51 (11S) ◽  
pp. 11PA02 ◽  
Author(s):  
Tomoki Tanemura ◽  
Shuichi Yamashita ◽  
Hiroyuki Wado ◽  
Yukihiro Takeuchi ◽  
Toshiyuki Tsuchiya ◽  
...  
Keyword(s):  
Thin Film ◽  
Polycrystalline Silicon ◽  
Fatigue Testing ◽  
Silicon Thin Film ◽  
Bending Vibration ◽  
Out Of Plane ◽  
Plane Bending ◽  
Thin Film Membrane

Fatigue Testing of Polycrystalline Silicon Thin-Film Membrane Using Out-of-Plane Bending Vibration

2012 ◽  
Vol 51 ◽  
pp. 11PA02 ◽  
Author(s):  
Tomoki Tanemura ◽  
Shuichi Yamashita ◽  
Hiroyuki Wado ◽  
Yukihiro Takeuchi ◽  
Toshiyuki Tsuchiya ◽  
...  
Keyword(s):  
Thin Film ◽  
Polycrystalline Silicon ◽  
Fatigue Testing ◽  
Silicon Thin Film ◽  
Bending Vibration ◽  
Out Of Plane ◽  
Plane Bending ◽  
Thin Film Membrane

Threshold voltage of excimer-laser-annealed polycrystalline silicon thin-film transistors

2000 ◽  
Vol 76 (17) ◽  
pp. 2442-2444 ◽  
Author(s):  
C. T. Angelis ◽  
C. A. Dimitriadis ◽  
F. V. Farmakis ◽  
J. Brini ◽  
G. Kamarinos ◽  
...  
Keyword(s):  
Thin Film ◽  
Excimer Laser ◽  
Threshold Voltage ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Silicon Thin Film

Dynamic-Gate-Stress-Induced Degradation in Bridged-Grain Polycrystalline Silicon Thin-Film Transistors

2016 ◽  
Vol 63 (10) ◽  
pp. 3964-3970 ◽  
Author(s):  
Meng Zhang ◽  
Zhihe Xia ◽  
Wei Zhou ◽  
Rongsheng Chen ◽  
Man Wong ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Silicon Thin Film
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