Electron detachment cross section of H- induced by collisions with O2

Author(s):  
Santiago Vergara ◽  
Aldo A Martínez ◽  
F R Peñalver ◽  
G Hinojosa
1984 ◽  
Vol 62 (6) ◽  
pp. 544-547 ◽  
Author(s):  
B. Hird ◽  
F. Rahman

The cross section σ−+ for double electron detachment from Cl− in a single collision with a rare gas atom has been measured between 12.5 and 122.5 keV. The magnitude of these cross sections shows that there is a good probability that a second electron will be emitted in collisions that detach one electron, particularly with light targets. The centre-of-mass cross section decreases with increasing target mass, but the variation is less than that for F− and O− double electron detachment cross sections.


2014 ◽  
Vol 89 (1) ◽  
Author(s):  
Ginette Jalbert ◽  
R. F. Nascimento ◽  
Carlos R. de Carvalho ◽  
Carla R. Carvalho ◽  
B. F. Magnani ◽  
...  

2013 ◽  
Vol 91 (2) ◽  
pp. 175-179 ◽  
Author(s):  
Zhixian Geng ◽  
Xue Bai ◽  
Baoren Wei ◽  
Xuemei Zhang

The single-electron detachment (SED) cross sections for Co− and Ir− in collision with Ar in the energy region of 10–30 keV are obtained in our laboratory. As our previous paper reported, the SED cross sections have velocity and electron affinity dependency. Using the least-squares method, we analyze the available experimental data of SED cross sections for different negative ions in collision with Ar, and get empirical formulas for different sets of anionic projectiles. For most anionic projectiles, there is a clear correlation between increasing electron affinity and decreasing SED cross sections. Co and Ir, however, are an exception, and we discuss how other physical parameters can be taken into account in the search for general scaling rules for SED cross sections. As the incident velocity increases, the cross section dependence of the anion's electron affinity becomes weaker, and the relation between the SED cross sections and νp is supposed to be [Formula: see text].


1979 ◽  
Vol 64 (1) ◽  
pp. 175-177 ◽  
Author(s):  
C. De Vreugd ◽  
R.W. Wijnaendts Van Resandt ◽  
J. Los

The close-coupling theory of electron detachment, developed in the preceding paper I, is used to calculate the probability of survival of the negative ion, and the total probability of electron detachment. Neglect of a term reduces the formulas to more familiar ones, which are then used to calculate differential elastic cross sections and total detachment cross sections for the H - –He and D - –He systems. Good agreement with experi­mental results is obtained.


1988 ◽  
Vol 102 ◽  
pp. 71-73
Author(s):  
E. Jannitti ◽  
P. Nicolosi ◽  
G. Tondello

AbstractThe photoabsorption spectra of the carbon ions have been obtained by using two laser-produced plasmas. The photoionization cross-section of the CV has been absolutely measured and the value at threshold, σ=(4.7±0.5) × 10−19cm2, as well as its behaviour at higher energies agrees quite well with the theoretical calculations.


Author(s):  
J. Langmore ◽  
M. Isaacson ◽  
J. Wall ◽  
A. V. Crewe

High resolution dark field microscopy is becoming an important tool for the investigation of unstained and specifically stained biological molecules. Of primary consideration to the microscopist is the interpretation of image Intensities and the effects of radiation damage to the specimen. Ignoring inelastic scattering, the image intensity is directly related to the collected elastic scattering cross section, σɳ, which is the product of the total elastic cross section, σ and the eficiency of the microscope system at imaging these electrons, η. The number of potentially bond damaging events resulting from the beam exposure required to reduce the effect of quantum noise in the image to a given level is proportional to 1/η. We wish to compare η in three dark field systems.


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