Predictive 3D modelling of erosion and deposition in ITER with ERO2.0: from beryllium main wall, tungsten divertor to full-tungsten device

Abstract Erosion and deposition is modelled with ERO2.0 for a hypothetical full-tungsten ITER for an ELM-free H-Mode baseline deuterium discharge. A parameter study considering seeding impurities (Ne, Ar, Kr, Xe) at constant percentages (0.05% to 1.0%) of the deuterium ion flux is done while neglecting their radiation cooling and core plasma compatibility. With pure deuterium plasma, tungsten main wall erosion is only due to charge exchange deuterium atoms and self-sputtering and there is only minor tungsten divertor sputtering. With a beryllium main wall, beryllium erosion is due to deuterium ions, charge exchange deuterium neutrals and self-sputtering. For this case, tungsten in the divertor is eroded by beryllium ions and self-sputtering. The simulations for full-tungsten device including seeded impurities leads to significant tungsten erosion in the divertor. In general, tungsten erosion, self-sputtering and deposition increase by factors larger than 50 at the main wall and 5000 in the divertor compared to pure deuterium plasma

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Influence of tungsten microstructure and ion flux on deuterium plasma-induced surface modifications and deuterium retention

Journal of Nuclear Materials ◽

10.1016/j.jnucmat.2014.12.006 ◽

2015 ◽

Vol 463 ◽

pp. 320-324 ◽

Cited By ~ 27

Author(s):

L. Buzi ◽

G. De Temmerman ◽

B. Unterberg ◽

M. Reinhart ◽

T. Dittmar ◽

...

Keyword(s):

Surface Modifications ◽

Ion Flux ◽

Deuterium Plasma ◽

Deuterium Retention

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First H+ Charge-Exchange Images in the Stim.

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100092487 ◽

1976 ◽

Vol 34 ◽

pp. 504-505

Author(s):

Wm. H. Escovitz ◽

T. R. Fox ◽

R. Levi-Setti

Keyword(s):

Charge Exchange ◽

Neutral Component ◽

Channel Electron Multiplier ◽

Electron Multiplier ◽

Neutral Particles ◽

Charged Beam ◽

Scanning Transmission ◽

Contrast Mechanism ◽

Ion Microscopy ◽

Beam Component

Charge exchange, the neutralization of ions by electron capture as the ions traverse matter, is a well-known phenomenon of atomic physics which is relevant to ion microscopy. In conventional transmission ion microscopes, the neutral component of the beam after it emerges from the specimen cannot be focused. The scanning transmission ion microscope (STIM) enables the detection of this signal to make images. Experiments with a low-resolution 55 kV STIM indicate that the charge-exchange signal provides a new contrast mechanism to detect extremely small amounts of matter. In an early version of charge-exchange detection (fig. 1), a permanent magnet installed between the specimen and the detector (a channel electron multiplier) sweeps the charged beam component away from the detector and allows only the neutrals to reach it. When the magnet is removed, both charged and neutral particles reach the detector.

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