Applicability of non-linear imaging in high-resolution transmission electron microscopy

2017 ◽  
Vol 66 (6) ◽  
pp. 406-413 ◽  
Author(s):  
Yunjie Chang ◽  
Shouqing Li ◽  
Yumei Wang ◽  
Binghui Ge
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Transmission Electron ◽  
Non Linear

Investigation of non-linear imaging in high-resolution transmission electron microscopy

Microscopy ◽  
2016 ◽  
Vol 65 (6) ◽  
pp. 465-472 ◽  
Author(s):  
Yunjie Chang ◽  
Yumei Wang ◽  
Yanxiang Cui ◽  
Binghui Ge
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Transmission Electron ◽  
Non Linear

Quantitative determination of imaging parameters and composition from high-resolution transmission electron microscopy lattice images

1996 ◽  
Vol 54 ◽  
pp. 96-97
Author(s):  
D. Stenkamp
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Sample Thickness ◽  
Inelastic Electron ◽  
Local Composition ◽  
Transmission Electron ◽  
Non Linear ◽  
Lattice Images

A quantitative method for the direct determination of defocus Δf, local sample thickness t and local composition x from high-resolution transmission electron microscopy (HRTEM) lattice images of wedge-shaped samples is described. The method is applicable to a wide class of crystalline materials comprising elemental semiconductors, elemental metals and substitutional random alloys composed of these elements. The proposed method relies on the functional dependence of linear and non-linear image Fourier coefficients on the parameters defocus Δf, sample thickness t and composition x. This relationship is analytically derived by application of the Bloch wave formalism and the non-linear imaging theory to the HRTEM imaging process. Influences of inelastic electron scattering and partially coherent illumination conditions are taken into account explicitly.

A High Resolution Study of G.P. Zones in Aluminum - 4.2 at % Silver

1982 ◽  
Vol 40 ◽  
pp. 722-723 ◽  
Author(s):  
R. Gronsky
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Computer Simulations ◽  
Structural Characteristics ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Resolution Study

The phenomenon of clustering in Al-Ag alloys has been extensively studied since the early work of Guinierl, wherein the pre-precipitation state was characterized as an assembly of spherical, ordered, silver-rich G.P. zones. Subsequent x-ray and TEM investigations yielded results in general agreement with this model. However, serious discrepancies were later revealed by the detailed x-ray diffraction - based computer simulations of Gragg and Cohen, i.e., the silver-rich clusters were instead octahedral in shape and fully disordered, atleast below 170°C. The object of the present investigation is to examine directly the structural characteristics of G.P. zones in Al-Ag by high resolution transmission electron microscopy.

Improved quantification of curvature in high-resolution transmission electron microscopy lattice fringe micrographs of soots

Carbon ◽  
2017 ◽  
Vol 117 ◽  
pp. 174-181 ◽  
Author(s):  
Chang’an Wang ◽  
Thomas Huddle ◽  
Chung-Hsuan Huang ◽  
Wenbo Zhu ◽  
Randy L. Vander Wal ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Lattice Fringe ◽  
Transmission Electron
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