Boundary-artifact-free determination of potential distribution from differential phase contrast signals

2017 ◽  
Vol 66 (6) ◽  
pp. 397-405 ◽  
Author(s):  
Akimitsu Ishizuka ◽  
Masaaki Oka ◽  
Takehito Seki ◽  
Naoya Shibata ◽  
Kazuo Ishizuka
Keyword(s):  
Potential Distribution ◽  
Phase Contrast ◽  
Differential Phase ◽  
Differential Phase Contrast

scholarly journals Numerical Procedures to determine Potential Distribution from Electronic Field Vectors observed in Differential Phase Contrast (DPC) imaging

2017 ◽  
Vol 23 (S1) ◽  
pp. 34-35 ◽  
Author(s):  
Akimitsu Ishizuka ◽  
Masaaki Oka ◽  
Kazuo Ishizuka ◽  
Takehito Seki ◽  
Naoya Shibata
Keyword(s):  
Potential Distribution ◽  
Phase Contrast ◽  
Differential Phase ◽  
Differential Phase Contrast ◽  
Electronic Field

The role of differential phase contrast in electron microscopy

1978 ◽  
Vol 36 (1) ◽  
pp. 176-177
Author(s):  
E.M. Waddell ◽  
J.N. Chapman ◽  
R.P. Ferrier
Keyword(s):  
Phase Contrast ◽  
Practical Method ◽  
Position Vector ◽  
Differential Phase ◽  
Pure Phase ◽  
Differential Phase Contrast ◽  
The Difference ◽  
Image Position ◽  
First Moment

Dekkers and de Lang (1977) have discussed a practical method of realising differential phase contrast in a STEM. The method involves taking the difference signal from two semi-circular detectors placed symmetrically about the optic axis and subtending the same angle (2α) at the specimen as that of the cone of illumination. Such a system, or an obvious generalisation of it, namely a quadrant detector, has the characteristic of responding to the gradient of the phase of the specimen transmittance. In this paper we shall compare the performance of this type of system with that of a first moment detector (Waddell et al.1977).For a first moment detector the response function R(k) is of the form R(k) = ck where c is a constant, k is a position vector in the detector plane and the vector nature of R(k)indicates that two signals are produced. This type of system would produce an image signal given bywhere the specimen transmittance is given by a (r) exp (iϕ (r), r is a position vector in object space, ro the position of the probe, ⊛ represents a convolution integral and it has been assumed that we have a coherent probe, with a complex disturbance of the form b(r-ro) exp (iζ (r-ro)). Thus the image signal for a pure phase object imaged in a STEM using a first moment detector is b2 ⊛ ▽ø. Note that this puts no restrictions on the magnitude of the variation of the phase function, but does assume an infinite detector.

scholarly journals Ultrasound differential phase contrast using backscattering and the memory effect

2021 ◽  
Vol 118 (12) ◽  
pp. 124103
Author(s):  
Timothy D. Weber ◽  
Nikunj Khetan ◽  
Ruohui Yang ◽  
Jerome Mertz
Keyword(s):  
Memory Effect ◽  
Phase Contrast ◽  
Differential Phase ◽  
Differential Phase Contrast

scholarly journals Fast 3D reconstruction method for differential phase contrast X-ray CT

2016 ◽  
Vol 24 (13) ◽  
pp. 14564 ◽  
Author(s):  
Michael T. McCann ◽  
Masih Nilchian ◽  
Marco Stampanoni ◽  
Michael Unser
Keyword(s):  
3D Reconstruction ◽  
Phase Contrast ◽  
Reconstruction Method ◽  
X Ray ◽  
Differential Phase ◽  
Differential Phase Contrast
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