Effects of Races 0 and 1 ofExserohilum turcicumon Sweet Corn Hybrids Differing forHt-and Partial Resistance to Northern Leaf Blight

Plant Disease ◽  
1994 ◽  
Vol 78 (12) ◽  
pp. 1189 ◽  
Author(s):  
J. K. PATAKY
Keyword(s):  
Partial Resistance ◽  
Sweet Corn ◽  
Leaf Blight ◽  
Northern Leaf Blight ◽  
Corn Hybrids

scholarly journals Disease Severity and Yield of Sweet Corn Hybrids with Resistance to Northern Leaf Blight

Plant Disease ◽  
1998 ◽  
Vol 82 (1) ◽  
pp. 57-63 ◽  
Author(s):  
J. K. Pataky ◽  
R. N. Raid ◽  
L. J. du Toit ◽  
T. J. Schueneman
Keyword(s):  
Disease Severity ◽  
Partial Resistance ◽  
Yield Loss ◽  
Sweet Corn ◽  
Correlation Coefficients ◽  
Inbred Lines ◽  
Leaf Blight ◽  
Northern Leaf Blight ◽  
Corn Hybrids ◽  
Highly Correlated

Reactions of supersweet (sh2) sweet corn to northern leaf blight (NLB) and associated yields were evaluated in Belle Glade, Florida and Urbana, Illinois in yield-loss trials, hybrid evaluations, and evaluations of breeding materials. Hybrids differed significantly for NLB in all trials. Severity of NLB ranged from 0 to 66% on 35 sh2 hybrids in yield-loss trials, and from 0 to 60% on 80 sh2 hybrids in hybrid evaluations. NLB ratings ranged from 1 to 9 (approximately 0 to 80% severity) on 375 hybrids and 186 inbred lines in evaluations of breeding materials. Various methods of rating NLB and ratings from multiple dates were highly correlated, with correlation coefficients ranging from 0.76 to 0.98. Yield, measured as weight of ears and number of marketable ears from inoculated plots as a percentage of that from control plots, decreased as disease severity increased. Linear or quadratic regression models explained 31 to 70% of the variation in percent yield as a function of disease severity at harvest. The effects of NLB on yield were limited by NLB-resistance in several hybrids, including CCO 3268, Chieftain, Crisp N Sweet 710A, Day Star, Envy, Forever, GSS 1526, Jupiter, Midship, Prime Plus, Sch 5005, and SummerSweet 7630. Although high levels of partial resistance to NLB were prevalent among 375 new experimental sh2 hybrids and 186 sh2 inbred lines evaluated in 1995, use of the gene HtN may increase in the near future as breeders are incorporating this resistance into new inbreds and hybrids. Breeders and plant pathologists would be wise to continue improving partial resistance to NLB without using the gene HtN in genotypes with adequate levels of partial resistance, because the widespread use of the gene HtN will select for virulent races of Exserohilum turcicum which occur in Florida, or for races with new combinations of virulence.

scholarly journals SWEET CORN INBREDS WITH PARTIAL RESISTANCE TO NORTHERN LEAF BLIGHT AND STEWART'S WILT

HortScience ◽  
1990 ◽  
Vol 25 (9) ◽  
pp. 1067a-1067 ◽  
Author(s):  
A. C. Meyer ◽  
J. K Pataky ◽  
J.A. Juvik
Keyword(s):  
Partial Resistance ◽  
Sweet Corn ◽  
Leaf Blight ◽  
Exserohilum Turcicum ◽  
Northern Leaf Blight ◽  
Dent Corn ◽  
Erwinia Stewartii ◽  
Stewart's Wilt ◽  
Corn Inbred ◽  
Moderately Resistant

Approximately 200 sweet corn inbred lines were screened for two years for resistance to northern leaf blight, caused by Exserohilum turcicum, and Stewart's wilt, caused by Erwinia stewartii. Inbreds with the best levels of partial resistance to races 1 and 2 of E. turcicum included IL11d, IL676a, IL677a, IL685d, IL766a, IL767a and IL797a. Inbreds with the best partial resistance to E. stewartii included IL126b, IL676a, IL767a, IL772a, IL774g, IL797a, IL798a and M6011. Several of these resistant and moderately resistant inbreds had common ancestors; however, inspection of pedigrees suggested that resistance was derived from Puerto Rican, Bolivian, and other tropical sources and/or dent corn. Thus, many of the sweet corn inbreds may carry different genes for resistance and can be used for the development of populations with improved resistance.

scholarly journals Identification and Inheritance of Delayed First Pustule Appearance to Common leaf Rust in Sweet Corn

1995 ◽  
Vol 120 (4) ◽  
pp. 667-672 ◽  
Author(s):  
G.R. Gingera ◽  
D.W. Davis ◽  
J.V. Groth
Keyword(s):  
Disease Severity ◽  
Partial Resistance ◽  
Sweet Corn ◽  
Rank Correlation ◽  
Corn Hybrids ◽  
Breeding Lines ◽  
Puccinia Sorghi ◽  
Mean Delay ◽  
Field Environment ◽  
Wide Range

Partial resistance effectively reduces common leafrust (Puccinia sorghi Schw.) epidemics in sweet corn (Zea mays L.). One measurable field component of partial resistance is delayed first pustule appearance (FPA), influenced by latent period and infection efficiency. This is the first report of delayed FPA against common rust in sweet corn. Our objectives were to determine 1) if differences in delayed FPA could be assessed in a field environment, 2) the relationship between delayed FPA and disease severity, and 3) the inheritance of delayed FPA. FPA was screened in a field environment during 1992 and 1993 using two susceptible U.S. station inbreds and 32 breeding lines selected for partial resistance to common rust. The range in mean delay in FPA on a genotype basis was 2.4 to 5.0 days in 1992 and 1.5 to 7.4 days in 1993. Although the rank correlation of genotypes between years was small (r = 0.27), several breeding lines had longer delayed FPA in both years while others produced shorter FPA delay in both years. Seven commercial sweet corn hybrids with a wide range of partial resistance did not differ (P ≤ 0.05) for delayed FPA. There was no correlation between disease severity and delayed FPA (r2 = 0.00 to 0.21) for breeding lines or commercial hybrids, indicating that selection for delayed FPA may be conducted independently of disease severity. In a generation mean analysis conducted in 1993 and 1994 for three high x low delayed FPA crosses, the genetic control of delayed FPA was primarily additive. Dominant genetic effects were found in two crosses and epistasis was not significant in any cross.

scholarly journals Quantitative Trait Loci in Sweet Corn Associated with Partial Resistance to Stewart's Wilt, Northern Corn Leaf Blight, and Common Rust

2001 ◽  
Vol 91 (3) ◽  
pp. 293-300 ◽  
Author(s):  
A. F. Brown ◽  
J. A. Juvik ◽  
J. K. Pataky
Keyword(s):  
Quantitative Trait Loci ◽  
Quantitative Trait ◽  
Partial Resistance ◽  
Sweet Corn ◽  
Phenotypic Variability ◽  
Leaf Blight ◽  
Northern Corn Leaf Blight ◽  
Trait Loci ◽  
Stewart's Wilt ◽  
Corn Leaf Blight

Partial resistance to Stewart's wilt (Erwina stewartii, syn. Pantoea stewartii), northern corn leaf blight (NCLB) (Exserohilum turcicum), and common rust (Puccinia sorghi) was observed in an F2:3 population developed from a cross between the inbred sweet corn lines IL731a and W6786. The objective of this study was to identify quantitative trait loci (QTL) associated with partial resistance using restriction fragment length polymorphic markers. Phenotypic data were collected for 2 years for Stewart's wilt, NCLB, and common rust but, due to significant family-environment interaction, analysis was conducted individually on data from each year. In 2 years of evaluation for the three diseases, a total of 33 regions in the maize genome were associated with partial resistance describing from 5.9 to 18% of the total phenotypic variability. Of six regions common in both years, three were associated with partial resistance to Stewart's wilt (chromosomes 4:07, 5:03, and 6:04), one was associated with NCLB (chromosome 9:05), and two were associated with common rust (chromosomes 2:04 and 3:04). The rust QTL on 3S mapped to within 20 cM of the rp3 locus and explained 17.7% of the phenotypic variability. Some of the QTL associated with partial resistance to the three diseases have been reported previously, and some are described here for the first time. Results suggest it may be possible to consolidate QTL from various elite backgrounds in a manner analogous to the pyramiding of major resistance genes. We also report here on two QTL associated with anthocyanin production on chromosomes 10:6 and 5:03 in the general location of the a2 gene.

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