Noise Due to Photon Counting Statistics in Computed X-Ray Tomography

1977 ◽  
Vol 1 (1) ◽  
pp. 64-74 ◽  
Author(s):  
David A. Chesler ◽  
Stephen J. Riederer ◽  
Norbert J. Pelc
1989 ◽  
Vol 67 (1) ◽  
pp. 89-94 ◽  
Author(s):  
N. D. Lloyd ◽  
E. J. Llewellyn

A method for the deconvolution of blurred images that uses photon counting Poisson statistics to determine the most probable solution is described. The method ensures that the final solution is physically meaningful and consistent with the observations. The developed algorithm is tested with real blurred data, and the result is compared with other methods. These tests show that the algorithm produces stable results that are in good agreement with the true answer.


1987 ◽  
Vol 31 ◽  
pp. 77-85
Author(s):  
Thomas L. Nunes ◽  
Charles C. Goldsmith

AbstractThe semiconductor industry is continually striving'for smaller, denser devices. Microdiffractometry is an analytical technique which endeavors to apply x-ray diffraction techniques for measuring strain and phase information to areas approaching 50 micrometers diameter or less.This study extends the work of Goldsmith and Walker in the measurement of strain using the lattice distortion or sin2(ψ) plot method.The systematic errors arising from both sample and beam displacement relative to the center of rotation of the cample ie examined. A relationship is derived which predicts the influence of these displacements upon the slope of a stress plot. The predictions are compared to experiment.The influence of random errors arising from particle size and photon counting statistics will also be discussed. Guidelines will be presented which will minimize both systematic and random errors.


2019 ◽  
Vol 99 (8) ◽  
Author(s):  
Fredrik Brange ◽  
Paul Menczel ◽  
Christian Flindt

1993 ◽  
Vol 102 (3-4) ◽  
pp. 379-390 ◽  
Author(s):  
Ullrich Martini ◽  
Christian Ginzel ◽  
Axel Schenzle

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