Nonreciprocal Thermal Emitters Using Metasurfaces with Multiple Diffraction Channels

2021 ◽  
Vol 16 (6) ◽  
Author(s):  
Bo Zhao ◽  
Jiahui Wang ◽  
Zhexin Zhao ◽  
Cheng Guo ◽  
Zongfu Yu ◽  
...  
Keyword(s):  
Multiple Diffraction ◽  
Thermal Emitters

Symmetry breaking in convergent-beam diffraction

1989 ◽  
Vol 47 ◽  
pp. 480-481
Author(s):  
D.J. Eaglesham
Keyword(s):  
Symmetry Breaking ◽  
Point Group ◽  
X Ray Diffraction ◽  
Multiple Diffraction ◽  
Space Groups ◽  
Atomic Displacements ◽  
Small Probe ◽  
Phase Sensitive ◽  
Convergent Beam

Convergent Beam Electron Diffraction is now almost routinely used in the determination of the point- and space-groups of crystalline samples. In addition to its small-probe capability, CBED is also postulated to be more sensitive than X-ray diffraction in determining crystal symmetries. Multiple diffraction is phase-sensitive, so that the distinction between centro- and non-centro-symmetric space groups should be trivial in CBED: in addition, the stronger scattering of electrons may give a general increase in sensitivity to small atomic displacements. However, the sensitivity of CBED symmetry to the crystal point group has rarely been quantified, and CBED is also subject to symmetry-breaking due to local strains and inhomogeneities. The purpose of this paper is to classify the various types of symmetry-breaking, present calculations of the sensitivity, and illustrate symmetry-breaking by surface strains.CBED symmetry determinations usually proceed by determining the diffraction group along various zone axes, and hence finding the point group. The diffraction group can be found using either the intensity distribution in the discs

scholarly journals High-resolution characterization of the forbidden Si 200 and Si 222 reflections

2015 ◽  
Vol 48 (2) ◽  
pp. 528-532 ◽  
Author(s):  
Peter Zaumseil
Keyword(s):  
High Resolution ◽  
Angular Range ◽  
Angular Divergence ◽  
X Ray Diffraction ◽  
Multiple Diffraction ◽  
Diffraction Plane ◽  
X Ray ◽  
Sample Orientation ◽  
Plane Sample

The occurrence of the basis-forbidden Si 200 and Si 222 reflections in specular X-ray diffraction ω–2Θ scans is investigated in detail as a function of the in-plane sample orientation Φ. This is done for two different diffractometer types with low and high angular divergence perpendicular to the diffraction plane. It is shown that the reflections appear for well defined conditions as a result of multiple diffraction, and not only do the obtained peaks vary in intensity but additional features like shoulders or even subpeaks may occur within a 2Θ range of about ±2.5°. This has important consequences for the detection and verification of layer peaks in the corresponding angular range.

scholarly journals Neutron Stars—Thermal Emitters

2014 ◽  
Vol 191 (1-4) ◽  
pp. 171-206 ◽  
Author(s):  
Alexander Y. Potekhin ◽  
Andrea De Luca ◽  
José A. Pons
Keyword(s):  
Neutron Stars ◽  
Thermal Emitters

An algorithm for calculating diffraction profiles of 2θ scans for multiple diffraction from crystals and thin films

2014 ◽  
Vol 70 (6) ◽  
pp. 572-582
Author(s):  
Hsin-Yi Chen ◽  
Mau-Sen Chiu ◽  
Chia-Hung Chu ◽  
Shih-Lin Chang
Keyword(s):  
Initial Phase ◽  
Atomic Layer ◽  
Dynamical Theory ◽  
Far Field ◽  
X Rays ◽  
X Ray Diffraction ◽  
Multiple Diffraction ◽  
X Ray ◽  
Beam Surface ◽  
Surface Diffraction

An algorithm is developed based on the dynamical theory of X-ray diffraction for calculating the profiles of the diffracted beam,i.e.the diagrams of the intensity distributionversus2θ when a crystal is fixed at an angle of its maximum diffracted intensity. Similar to Fraunhofer (far-field) diffraction for a single-slit case, in the proposed algorithm the diffracted beam from one atomic layer excited by X-rays is described by the composition of (N+ 1) coherent point oscillators in the crystal. The amplitude and the initial phase of the electric field for each oscillator can be calculated based on the dynamical theory with given boundary conditions. This algorithm not only gives diffraction profiles but also provides the contribution of the excitation of modes when extremely asymmetric diffraction is involved in the diffraction process. Examples such as extremely asymmetric two-beam surface diffraction and three-beam surface diffraction are presented and discussed in detail.

Study of β-quartz by neutron multiple diffraction

1994 ◽  
Vol 27 (4) ◽  
pp. 475-481 ◽  
Author(s):  
V. L. Mazzocchi ◽  
C. B. R. Parente
Keyword(s):  
Multiple Diffraction
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