Computer simulation of knife-edge based approximate methods for multiple diffraction estimation

Author(s):  
N. Cerovac ◽  
Z. Blazevic ◽  
M. Sekelja
2013 ◽  
Vol 21 (21) ◽  
pp. 25069 ◽  
Author(s):  
C. Huber ◽  
S. Orlov ◽  
P. Banzer ◽  
G. Leuchs

2020 ◽  
Vol 8 ◽  
Author(s):  
Sergej Orlov ◽  
Christian Huber ◽  
Pavel Marchenko ◽  
Peter Banzer ◽  
Gerd Leuchs

The knife-edge method is an established technique for profiling of even tightly focused light beams. However, the straightforward implementation of this method fails if the materials and geometry of the knife-edges are not chosen carefully or, in particular, if knife-edges are used that are made of pure materials. Artifacts are introduced in these cases in the shape and position of the reconstructed beam profile due to the interaction of the light beam under study with the knife. Hence, corrections to the standard knife-edge evaluation method are required. Here we investigate the knife-edge method for highly focused radially and azimuthally polarized beams and their linearly polarized constituents. We introduce relative shifts for those constituents and report on the consistency with the case of a linearly polarized fundamental Gaussian beam. An adapted knife-edge reconstruction technique is presented and proof-of-concept tests are shown, demonstrating the reconstruction of beam profiles.


Author(s):  
Fuhao Ji ◽  
Jorge Giner Navarro ◽  
Pietro Musumeci ◽  
Daniel B. Durham ◽  
Andrew M. Minor ◽  
...  

2016 ◽  
Vol 24 (8) ◽  
pp. 8214 ◽  
Author(s):  
C. Huber ◽  
S. Orlov ◽  
P. Banzer ◽  
G. Leuchs

Author(s):  
D.J. Eaglesham

Convergent Beam Electron Diffraction is now almost routinely used in the determination of the point- and space-groups of crystalline samples. In addition to its small-probe capability, CBED is also postulated to be more sensitive than X-ray diffraction in determining crystal symmetries. Multiple diffraction is phase-sensitive, so that the distinction between centro- and non-centro-symmetric space groups should be trivial in CBED: in addition, the stronger scattering of electrons may give a general increase in sensitivity to small atomic displacements. However, the sensitivity of CBED symmetry to the crystal point group has rarely been quantified, and CBED is also subject to symmetry-breaking due to local strains and inhomogeneities. The purpose of this paper is to classify the various types of symmetry-breaking, present calculations of the sensitivity, and illustrate symmetry-breaking by surface strains.CBED symmetry determinations usually proceed by determining the diffraction group along various zone axes, and hence finding the point group. The diffraction group can be found using either the intensity distribution in the discs


Author(s):  
Kiyomichi Nakai ◽  
Yusuke Isobe ◽  
Chiken Kinoshita ◽  
Kazutoshi Shinohara

Induced spinodal decomposition under electron irradiation in a Ni-Au alloy has been investigated with respect to its basic mechanism and confirmed to be caused by the relaxation of coherent strain associated with modulated structure. Modulation of white-dots on structure images of modulated structure due to high-resolution electron microscopy is reduced with irradiation. In this paper the atom arrangement of the modulated structure is confirmed with computer simulation on the structure images, and the relaxation of the coherent strain is concluded to be due to the reduction of phase-modulation.Structure images of three-dimensional modulated structure along <100> were taken with the JEM-4000EX high-resolution electron microscope at the HVEM Laboratory, Kyushu University. The transmitted beam and four 200 reflections with their satellites from the modulated structure in an fee Ni-30.0at%Au alloy under illumination of 400keV electrons were used for the structure images under a condition of the spherical aberration constant of the objective lens, Cs = 1mm, the divergence of the beam, α = 3 × 10-4 rad, underfocus, Δf ≃ -50nm and specimen thickness, t ≃ 15nm. The CIHRTEM code was used for the simulation of the structure image.


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