Measurement of the occupation lengths of channeled 17-MeV electrons and 54-MeV electrons and positrons in silicon by means of channeling radiation
1981 ◽
Vol 28
(2)
◽
pp. 1152-1155
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1991 ◽
Vol 260
(1-2)
◽
pp. 235-239
◽
1988 ◽
Vol 33
(1-4)
◽
pp. 39-41
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