Sampling depth in conversion-electron detection used for x-ray absorption

1992 ◽  
Vol 46 (11) ◽  
pp. 7144-7152 ◽  
Author(s):  
T. Girardeau ◽  
J. Mimault ◽  
M. Jaouen ◽  
P. Chartier ◽  
G. Tourillon
Keyword(s):  
Conversion Electron ◽  
Sampling Depth ◽  
X Ray ◽  
Electron Detection ◽  
X Ray Absorption

Conversion-electron extended X-ray absorption fine structure of ion-implanted nanocrystalline evaporated films

1990 ◽  
Vol 2 (41) ◽  
pp. 8113-8122 ◽  
Author(s):  
M Jaouen ◽  
P Bouillaud ◽  
T Girardeau ◽  
P Chartier ◽  
J Mimault ◽  
...  
Keyword(s):  
Fine Structure ◽  
Conversion Electron ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption ◽  
Ion Implanted

Amorphous-to-crystalline transition in Tb33Fe66 films studied via EXAFS

1993 ◽  
Vol 321 ◽  
Author(s):  
V. G. Hams ◽  
B. N. Das ◽  
W. T. Elam ◽  
N. C. Koon
Keyword(s):  
Conversion Electron ◽  
Quantitative Measurement ◽  
Radial Distance ◽  
Heat Treatments ◽  
Exafs Data ◽  
X Ray ◽  
Fe Sites ◽  
Sputter Deposited ◽  
X Ray Absorption

AbstractThe amorphous-to-crystalline transition in sputter-deposited amorphous Tb33Fe66 films has been studied using a conversion-electron extended X-ray absorption (EXAFS) technique. Modeling of the EXAFS data using theoretical and empirical standards allowed the quantitative measurement of coordination, radial distance, and disorder of local atom shells around the Fe sites after varying degrees of heat treatments.

scholarly journals Electron sampling depth and saturation effects in perovskite films investigated by soft x-ray absorption spectroscopy

2014 ◽  
Vol 90 (12) ◽  
Author(s):  
A. Ruosi ◽  
C. Raisch ◽  
A. Verna ◽  
R. Werner ◽  
B. A. Davidson ◽  
...  
Keyword(s):  
Absorption Spectroscopy ◽  
Sampling Depth ◽  
X Ray ◽  
Saturation Effects ◽  
X Ray Absorption
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