van der Waals forces in atomic force microscopy operating in liquids: A spherical-tip model

Physical Review B ◽

10.1103/physrevb.46.7946 ◽

1992 ◽

Vol 46 (12) ◽

pp. 7946-7948 ◽

Author(s):

N. Garcia ◽

Vu Thien Binh

Keyword(s):

Atomic Force Microscopy ◽

Van Der Waals ◽

Van Der Waals Forces ◽

Force Microscopy ◽

Atomic Force ◽

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Discriminating short-range from van der Waals forces using total force data in noncontact atomic force microscopy

Physical Review B ◽

10.1103/physrevb.89.235417 ◽

2014 ◽

Vol 89 (23) ◽

Author(s):

Stefan Kuhn ◽

Philipp Rahe

Keyword(s):

Atomic Force Microscopy ◽

Short Range ◽

Van Der Waals ◽

Van Der Waals Forces ◽

Total Force ◽

Force Microscopy ◽

Atomic Force ◽

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Corrections to the van der Waals forces in application to atomic force microscopy

Surface Science ◽

10.1016/0039-6028(95)00025-9 ◽

1995 ◽

Vol 328 (1-2) ◽

pp. 129-134 ◽

Author(s):

M. Bordag ◽

G.L. Klimchitskaya ◽

V.M. Mostepanenko

Keyword(s):

Atomic Force Microscopy ◽

Van Der Waals ◽

Van Der Waals Forces ◽

Force Microscopy ◽

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Measurement and manipulation of van der Waals forces in atomic-force microscopy

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.587752 ◽

1994 ◽

Vol 12 (3) ◽

pp. 2251 ◽

Author(s):

Jeffrey L. Hutter

Keyword(s):

Atomic Force Microscopy ◽

Van Der Waals ◽

Van Der Waals Forces ◽

Force Microscopy ◽

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Manipulation of van der Waals forces to improve image resolution in atomic‐force microscopy

Journal of Applied Physics ◽

10.1063/1.352845 ◽

1993 ◽

Vol 73 (9) ◽

pp. 4123-4129 ◽

Author(s):

Jeffrey L. Hutter ◽

John Bechhoefer

Keyword(s):

Atomic Force Microscopy ◽

Van Der Waals ◽

Van Der Waals Forces ◽

Image Resolution ◽

Force Microscopy ◽

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Geometry effects on the van der Waals force in atomic force microscopy

Physical Review B ◽

10.1103/physrevb.56.4159 ◽

1997 ◽

Vol 56 (7) ◽

pp. 4159-4165 ◽

Author(s):

Peter Johansson ◽

Peter Apell

Keyword(s):

Atomic Force Microscopy ◽

Van Der Waals ◽

Van Der Waals Force ◽

Force Microscopy ◽

Atomic Force ◽

Geometry Effects

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Parametric tip model and force–distance relation for Hamaker constant determination from atomic force microscopy

Journal of Applied Physics ◽

10.1063/1.363680 ◽

1996 ◽

Vol 80 (11) ◽

pp. 6081-6090 ◽

Author(s):

C. Argento ◽

R. H. French

Keyword(s):

Atomic Force Microscopy ◽

Hamaker Constant ◽

Force Microscopy ◽

Atomic Force ◽

Constant Determination ◽

Distance Relation ◽

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Atomic-force-microscopy images of graphite due to van der Waals interactions

Physical Review B ◽

10.1103/physrevb.42.11757 ◽

1990 ◽

Vol 42 (18) ◽

pp. 11757-11761 ◽

Author(s):

Chuji Horie ◽

Hiroshi Miyazaki

Keyword(s):

Atomic Force Microscopy ◽

Van Der Waals ◽

Van Der Waals Interactions ◽

Force Microscopy ◽

Atomic Force ◽

Microscopy Images

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Evaluation of the van der Waals force for atomic force microscopy

Physical Review B ◽

10.1103/physrevb.72.033410 ◽

2005 ◽

Vol 72 (3) ◽

Author(s):

L. W. Bruch

Keyword(s):

Atomic Force Microscopy ◽

Van Der Waals ◽

Van Der Waals Force ◽

Force Microscopy ◽

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Atomic force microscopy as a tool to correlate nanostructure to properties of glasses

Journal of Non-Crystalline Solids ◽

10.1016/s0022-3093(97)00352-9 ◽

1997 ◽

Vol 222 (1-2) ◽

pp. 69-82 ◽

Author(s):

E Rädlein

Keyword(s):

Atomic Force Microscopy ◽

Force Microscopy ◽

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Localized electrochemical impedance measurements on nafion membranes: Observation and analysis of spatially diverse proton transport using atomic force microscopy

10.1021/scimeetings.0c01147 ◽

2020 ◽

Author(s):

xiaojiang wang

Keyword(s):

Atomic Force Microscopy ◽

Proton Transport ◽

Electrochemical Impedance ◽

Impedance Measurements ◽

Force Microscopy ◽

Atomic Force ◽

Nafion Membranes

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