Parametric tip model and force–distance relation for Hamaker constant determination from atomic force microscopy

C. Argento; R. H. French

doi:10.1063/1.363680

Parametric tip model and force–distance relation for Hamaker constant determination from atomic force microscopy

Journal of Applied Physics ◽

10.1063/1.363680 ◽

1996 ◽

Vol 80 (11) ◽

pp. 6081-6090 ◽

Cited By ~ 136

Author(s):

C. Argento ◽

R. H. French

Keyword(s):

Atomic Force Microscopy ◽

Hamaker Constant ◽

Force Microscopy ◽

Atomic Force ◽

Constant Determination ◽

Distance Relation ◽

Tip Model

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Real-time Topography and Hamaker Constant Estimation in Atomic Force Microscopy Based on Adaptive Fading Extended Kalman Filter

International Journal of Control Automation and Systems ◽

10.1007/s12555-020-0076-7 ◽

2021 ◽

Author(s):

Milad Seifnejad Haghighi ◽

Hossein Nejat Pishkenari

Keyword(s):

Atomic Force Microscopy ◽

Kalman Filter ◽

Real Time ◽

Extended Kalman Filter ◽

Hamaker Constant ◽

Force Microscopy ◽

Atomic Force

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van der Waals forces in atomic force microscopy operating in liquids: A spherical-tip model

Physical Review B ◽

10.1103/physrevb.46.7946 ◽

1992 ◽

Vol 46 (12) ◽

pp. 7946-7948 ◽

Cited By ~ 28

Author(s):

N. Garcia ◽

Vu Thien Binh

Keyword(s):

Atomic Force Microscopy ◽

Van Der Waals ◽

Van Der Waals Forces ◽

Force Microscopy ◽

Atomic Force ◽

Tip Model

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Toward an Improved Method for Determining the Hamaker Constant of Solid Materials Using Atomic Force Microscopy. I. Quasi-Static Analysis for Arbitrary Surface Roughness

The Journal of Physical Chemistry C ◽

10.1021/acs.jpcc.9b09669 ◽

2020 ◽

Vol 124 (5) ◽

pp. 3014-3027 ◽

Cited By ~ 2

Author(s):

Michael C. Stevenson ◽

Stephen P. Beaudoin ◽

David S. Corti

Keyword(s):

Surface Roughness ◽

Atomic Force Microscopy ◽

Static Analysis ◽

Hamaker Constant ◽

Improved Method ◽

Solid Materials ◽

Force Microscopy ◽

Atomic Force

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Toward an Improved Method for Determining the Hamaker Constant of Solid Materials Using Atomic Force Microscopy. II. Dynamic Analysis and Preliminary Validation

The Journal of Physical Chemistry C ◽

10.1021/acs.jpcc.1c05052 ◽

2021 ◽

Vol 125 (36) ◽

pp. 20003-20013

Author(s):

Michael C. Stevenson ◽

Stephen P. Beaudoin ◽

David S. Corti

Keyword(s):

Atomic Force Microscopy ◽

Dynamic Analysis ◽

Hamaker Constant ◽

Improved Method ◽

Solid Materials ◽

Force Microscopy ◽

Atomic Force ◽

Preliminary Validation

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A method to quantitatively evaluate the Hamaker constant using the jump-into-contact effect in atomic force microscopy

Nanotechnology ◽

10.1088/0957-4484/18/3/035501 ◽

2007 ◽

Vol 18 (3) ◽

pp. 035501 ◽

Cited By ~ 33

Author(s):

Soma Das ◽

P A Sreeram ◽

A K Raychaudhuri

Keyword(s):

Atomic Force Microscopy ◽

Hamaker Constant ◽

Force Microscopy ◽

Atomic Force ◽

Contact Effect

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Atomic force microscopy spring constant determination in viscous liquids

Review of Scientific Instruments ◽

10.1063/1.3100258 ◽

2009 ◽

Vol 80 (3) ◽

pp. 035110 ◽

Cited By ~ 43

Author(s):

Tobias Pirzer ◽

Thorsten Hugel

Keyword(s):

Atomic Force Microscopy ◽

Spring Constant ◽

Viscous Liquids ◽

Force Microscopy ◽

Atomic Force ◽

Constant Determination

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Quantitative Normal Force Measurements by Means of Atomic Force Microscopy Towards the Accurate and Easy Spring Constant Determination

Nanoscience and Nanometrology ◽

10.11648/j.nsnm.20160201.12 ◽

2016 ◽

Vol 2 (1) ◽

pp. 8 ◽

Cited By ~ 5

Author(s):

Andrzej Sikora

Keyword(s):

Atomic Force Microscopy ◽

Normal Force ◽

Spring Constant ◽

Force Measurements ◽

Force Microscopy ◽

Atomic Force ◽

Constant Determination

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Atomic force microscopy as a tool to correlate nanostructure to properties of glasses

Journal of Non-Crystalline Solids ◽

10.1016/s0022-3093(97)00352-9 ◽

1997 ◽

Vol 222 (1-2) ◽

pp. 69-82 ◽

Cited By ~ 24

Author(s):

E Rädlein

Keyword(s):

Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force

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Localized electrochemical impedance measurements on nafion membranes: Observation and analysis of spatially diverse proton transport using atomic force microscopy

10.1021/scimeetings.0c01147 ◽

2020 ◽

Author(s):

xiaojiang wang

Keyword(s):

Atomic Force Microscopy ◽

Proton Transport ◽

Electrochemical Impedance ◽

Impedance Measurements ◽

Force Microscopy ◽

Atomic Force ◽

Nafion Membranes

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Don't ditch the NMR just yet: Using atomic force microscopy as an aid to solving problematic structures

Planta Medica ◽

10.1055/s-0032-1320223 ◽

2012 ◽

Vol 78 (11) ◽

Author(s):

M Jaspars

Keyword(s):

Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force

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