Model-independent determination of the strain distribution for aSi0.9Ge0.1/Si superlattice using x-ray diffractometry data

1996 ◽  
Vol 53 (13) ◽  
pp. 8277-8282 ◽  
Author(s):  
A. Yu. Nikulin ◽  
A. W. Stevenson ◽  
H. Hashizume
1996 ◽  
Vol 221 (1-4) ◽  
pp. 416-419 ◽  
Author(s):  
T. Ohkawa ◽  
Y. Yamaguchi ◽  
O. Sakata ◽  
M.K. Sanyal ◽  
A. Datta ◽  
...  

2021 ◽  
Vol 126 (9) ◽  
Author(s):  
M. Ablikim ◽  
M. N. Achasov ◽  
P. Adlarson ◽  
S. Ahmed ◽  
M. Albrecht ◽  
...  

1988 ◽  
Vol 206 (2) ◽  
pp. 187-189 ◽  
Author(s):  
E.L. Tomusiak ◽  
H. Arenhövel

2015 ◽  
Vol 51 (81) ◽  
pp. 15071-15074 ◽  
Author(s):  
Bora Joo ◽  
Eung-Gun Kim

Choosing a small active space of electrons for charge analysis allows the model-free determination of the degree of charge transfer.


1977 ◽  
Vol 3 (2) ◽  
pp. 131-132
Author(s):  
R. M. Hudson ◽  
R. M. Thomas ◽  
M. L. Duldig

In this paper we report an independent determination of the Location of the break (change in spectral index) in the spectrum of the diffuse X-ray background by applying a simple analysis technique to data already in the literature.


2020 ◽  
Vol 102 (5) ◽  
Author(s):  
M. Ablikim ◽  
M. N. Achasov ◽  
P. Adlarson ◽  
S. Ahmed ◽  
M. Albrecht ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document