scholarly journals (NH4)2Sx-treated InAs(001) surface studied by x-ray photoelectron spectroscopy and low-energy electron diffraction

1997 ◽  
Vol 56 (3) ◽  
pp. 1084-1086 ◽  
Author(s):  
Y. Fukuda ◽  
Y. Suzuki ◽  
N. Sanada ◽  
M. Shimomura ◽  
S. Masuda
Keyword(s):  
Electron Diffraction ◽  
Photoelectron Spectroscopy ◽  
Low Energy ◽  
Energy Electron ◽  
X Ray ◽  
Low Energy Electron Diffraction ◽  
Low Energy Electron

Cesium-induced Reconstruction on Si(113)3 × 2 Surface Studied by Low Energy Electron Diffraction and X-ray Photoelectron Spectroscopy

1997 ◽  
Vol 36 (Part 1, No. 5A) ◽  
pp. 2833-2836 ◽  
Author(s):  
Ki-Seok An ◽  
Chan-Cuk Hwang ◽  
Rae-Jun Park ◽  
Ju-Bong Lee ◽  
Jeong-Seon Kim ◽  
...  
Keyword(s):  
Electron Diffraction ◽  
Photoelectron Spectroscopy ◽  
Low Energy ◽  
Energy Electron ◽  
X Ray ◽  
Low Energy Electron Diffraction ◽  
Low Energy Electron
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