Determination of Atomic Form Factor of Silicon by Means of Coherent Bremsstrahlung of 1.2-GeV Electrons

1988 ◽  
Vol 60 (22) ◽  
pp. 2292-2294 ◽  
Author(s):  
I. Endo ◽  
M. Harada ◽  
K. Kitamura ◽  
T. Monaka ◽  
Y. Sumi ◽  
...  
1992 ◽  
Vol 166 (2) ◽  
pp. 140-144 ◽  
Author(s):  
M. Tobiyama ◽  
I. Endo ◽  
T. Kino ◽  
Y. Sumi ◽  
H. Uchida ◽  
...  

Author(s):  
F. Stanglmeier ◽  
B. Lengeler ◽  
W. Weber ◽  
H. Göbel ◽  
M. Schuster
Keyword(s):  
X Ray ◽  

Author(s):  
T. Geipel ◽  
W. Mader ◽  
P. Pirouz

Temperature affects both elastic and inelastic scattering of electrons in a crystal. The Debye-Waller factor, B, describes the influence of temperature on the elastic scattering of electrons, whereas the imaginary part of the (complex) atomic form factor, fc = fr + ifi, describes the influence of temperature on the inelastic scattering of electrons (i.e. absorption). In HRTEM simulations, two possible ways to include absorption are: (i) an approximate method in which absorption is described by a phenomenological constant, μ, i.e. fi; - μfr, with the real part of the atomic form factor, fr, obtained from Hartree-Fock calculations, (ii) a more accurate method in which the absorptive components, fi of the atomic form factor are explicitly calculated. In this contribution, the inclusion of both the Debye-Waller factor and absorption on HRTEM images of a (Oll)-oriented GaAs crystal are presented (using the EMS software.Fig. 1 shows the the amplitudes and phases of the dominant 111 beams as a function of the specimen thickness, t, for the cases when μ = 0 (i.e. no absorption, solid line) and μ = 0.1 (with absorption, dashed line).


1963 ◽  
Vol 11 (8) ◽  
pp. 387-390 ◽  
Author(s):  
L. I. Schiff ◽  
H. Collard ◽  
R. Hofstadter ◽  
A. Johansson ◽  
M. R. Yearian

2017 ◽  
Vol 95 (5) ◽  
pp. 427-431
Author(s):  
Erhan Cengiz

The LIII subshell photoelectric cross section, jump ratio, jump factor, and Davisson–Kirchner ratio of iridium have been determined by mass attenuation coefficients. The measurements have been performed using the X-ray attenuation method in narrow beam geometry. The obtained results have been compared with the tabulated values of XCOM (Berger et al. XCOM: Photon cross section database (version 1.3). NIST. Available at http://physics.nist.gov/xcom . 2005) and FFAST (Chantler et al. X-ray form factor, attenuation and scattering tables (version 2.1). NIST. Available at http://physics.nist.gov/ffast . 2005).


1992 ◽  
Author(s):  
T. Armstrong ◽  
D. Bettoni ◽  
V. Bharadwaj ◽  
C. Biino ◽  
G. Borreani ◽  
...  

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