High-Angular-Resolution Camera Coupled with an Undulator Source at the European Synchrotron Radiation Facility High-Brilliance Beamline

A waveguide microdiffraction setup is described for an undulator beamline at the European Synchrotron Radiation Facility. The composite optics consists of a waveguide, which confines the beam vertically, and a horizontally focusing multilayer mirror. A beam size of about 0.1 × 3 µm (vertical × horizontal) at λ = 0.095 nm has been obtained. The sample stage comprises a three-axis gantry with micrometre precision and a three-axis piezo-scanner with about 0.1 µm repeatability. Diffraction experiments are demonstrated for selected inorganic and polymeric samples. Possibilities for scanning diffractometry and small-angle scattering experiments are discussed.

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Industrial Research and Development with Synchrotron Radiation

Materials Science Forum ◽

10.4028/www.scientific.net/msf.638-642.2493 ◽

2010 ◽

Vol 638-642 ◽

pp. 2493-2498 ◽

Cited By ~ 2

Author(s):

Katja Kroschewski ◽

Adam Webb ◽

Thomas Wroblewski ◽

Karsten Wurr

Keyword(s):

Synchrotron Radiation ◽

Research And Development ◽

Angular Resolution ◽

Industrial Research ◽

High Angular Resolution ◽

High Brightness ◽

X Ray

The outstanding properties of synchrotron radiation (SR) allow manifold investigations of materials and processes which are not possible with conventional X-ray sources. Its high brightness allows extremely precise or time/spatial resolved measurements. In combination with its high collimation extremely high angular resolution is achievable. The white spectrum of SR allows tuning of the wavelength for spectroscopic applications or optimization according to the requirements of the experiment.

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Small-angle X-ray scattering at the european synchrotron radiation facility

Journal de Physique IV (Proceedings) ◽

10.1051/jp4:1993884 ◽

1993 ◽

Vol 03 (C8) ◽

pp. C8-403-C8-410

Author(s):

C. RIEKEL ◽

P. BÖSECKE ◽

O. DIAT ◽

P. ENGSTRÖM ◽

M. KOCSIS ◽

...

Keyword(s):

Synchrotron Radiation ◽

Small Angle ◽

European Synchrotron Radiation Facility ◽

X Ray ◽

X Ray Scattering ◽

Ray Scattering

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Small-Angle Electron Scattering (SAES) of Polymers

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100117467 ◽

1985 ◽

Vol 43 ◽

pp. 78-79

Author(s):

Ralph Oralor ◽

Pamela Lloyd ◽

Satish Kumar ◽

W. W. Adams

Keyword(s):

Electron Scattering ◽

Small Angle ◽

Angular Resolution ◽

Structural Features ◽

Objective Lens ◽

High Angular Resolution ◽

Push Button ◽

First Case ◽

Diffraction Mode ◽

Very High

Small angle electron scattering (SAES) has been used to study structural features of up to several thousand angstroms in polymers, as well as in metals. SAES may be done either in (a) long camera mode by switching off the objective lens current or in (b) selected area diffraction mode. In the first case very high camera lengths (up to 7Ø meters on JEOL 1Ø ØCX) and high angular resolution can be obtained, while in the second case smaller camera lengths (approximately up to 3.6 meters on JEOL 1Ø ØCX) and lower angular resolution is obtainable. We conducted our SAES studies on JEOL 1ØØCX which can be switched to either mode with a push button as a standard feature.

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A small-angle X-ray diffractometry station using a synchrotron radiation source: design and adjustment modes

Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment ◽

10.1016/0168-9002(94)01368-3 ◽

1995 ◽

Vol 359 (1-2) ◽

pp. 216-219 ◽

Cited By ~ 10

Author(s):

V.M Aul'chenko ◽

S.E Baru ◽

A.M Gadzhiev ◽

V.S Gerasimov ◽

V.N Korneev ◽

...

Keyword(s):

Synchrotron Radiation ◽

Small Angle ◽

Radiation Source ◽

Synchrotron Radiation Source ◽

X Ray

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Precise and nondestructive characterization of a ‘buried’ nanostructure in a polymer thin film using synchrotron radiation ultra-small angle X-ray scattering

Polymer Journal ◽

10.1038/pj.2012.133 ◽

2012 ◽

Vol 45 (3) ◽

pp. 307-312 ◽

Cited By ~ 3

Author(s):

Takamichi Shinohara ◽

Tomoko Shirahase ◽

Daiki Murakami ◽

Taiki Hoshino ◽

Moriya Kikuchi ◽

...

Keyword(s):

Thin Film ◽

Synchrotron Radiation ◽

Small Angle ◽

Polymer Thin Film ◽

X Ray ◽

X Ray Scattering ◽

Nondestructive Characterization ◽

Ray Scattering

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Design of small-angle X-ray diffractometer using synchrotron radiation at the photon factory

Nuclear Instruments and Methods in Physics Research ◽

10.1016/0167-5087(83)91170-5 ◽

1983 ◽

Vol 208 (1-3) ◽

pp. 471-477 ◽

Cited By ~ 154

Author(s):

Yoshiyuki Amemiya ◽

Katsuzo Wakabayashi ◽

Toshiaki Hamanaka ◽

Takeyuki Wakabayashi ◽

Tadashi Matsushita ◽

...

Keyword(s):

Synchrotron Radiation ◽

Small Angle ◽

X Ray ◽

Photon Factory

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A large-solid-angle X-ray Raman scattering spectrometer at ID20 of the European Synchrotron Radiation Facility

Journal of Synchrotron Radiation ◽

10.1107/s1600577516020579 ◽

2017 ◽

Vol 24 (2) ◽

pp. 521-530 ◽

Cited By ~ 46

Author(s):

S. Huotari ◽

Ch. J. Sahle ◽

Ch. Henriquet ◽

A. Al-Zein ◽

K. Martel ◽

...

Keyword(s):

Synchrotron Radiation ◽

Raman Scattering ◽

Solid Angle ◽

European Synchrotron Radiation Facility ◽

Electronic Excitations ◽

Raman Scattering Spectroscopy ◽

X Ray ◽

Area Detector ◽

Spectroscopic Tool

An end-station for X-ray Raman scattering spectroscopy at beamline ID20 of the European Synchrotron Radiation Facility is described. This end-station is dedicated to the study of shallow core electronic excitations using non-resonant inelastic X-ray scattering. The spectrometer has 72 spherically bent analyzer crystals arranged in six modular groups of 12 analyzer crystals each for a combined maximum flexibility and large solid angle of detection. Each of the six analyzer modules houses one pixelated area detector allowing for X-ray Raman scattering based imaging and efficient separation of the desired signal from the sample and spurious scattering from the often used complicated sample environments. This new end-station provides an unprecedented instrument for X-ray Raman scattering, which is a spectroscopic tool of great interest for the study of low-energy X-ray absorption spectra in materials under in situ conditions, such as in operando batteries and fuel cells, in situ catalytic reactions, and extreme pressure and temperature conditions.

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Information retrieval from X-ray small-angle scattering with polychromatic (`white') synchrotron radiation

Journal of Applied Crystallography ◽

10.1107/s0021889883009929 ◽

1983 ◽

Vol 16 (1) ◽

pp. 42-46 ◽

Cited By ~ 5

Author(s):

O. Glatter ◽

P. Laggner

Keyword(s):

Synchrotron Radiation ◽

Small Angle ◽

Particle Shape ◽

Structural Information ◽

Small Angle Scattering ◽

Radius Of Gyration ◽

X Ray ◽

Angle Scattering ◽

Slit Length ◽

Hinge Bending

The possibilities of obtaining structural information from X-ray small-angle scattering experiments with `white' polychromatic synchrotron radiation using line collimation are investigated by numerical simulation. Theoretical scattering curves of geometrical models were smeared with the appropriate wavelength distributions and slit-length functions, afflicted by statistical noise, and then evaluated by identical methods as normally used for experimental data, as described previously [program ITP; Glatter (1977). J. Appl. Cryst. 10, 415–421]. It is shown that even for a wavelength distribution of 50% half width, the information content is not limited to the parameters derived from the central part of the scattering curves, i.e. the radius of gyration and the zero-angle intensity, but also allows qualitative information on particle shape via the distance distribution function p(r). By a `hinge-bending model' consisting of two cylinders linked together at different angles it is demonstrated that changes in the radius of gyration amounting to less than 5% can be detected and quantified, and the qualitative changes in particle shape be reproduced.

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