Charge generation by heavy ions in power MOSFETs, burnout space predictions and dynamic SEB sensitivity

1992 ◽  
Vol 39 (6) ◽  
pp. 1704-1711 ◽  
Author(s):  
E.G. Stassinopoulos ◽  
G.J. Brucker ◽  
P. Calvel ◽  
A. Baiget ◽  
C. Peyrotte ◽  
...  
Keyword(s):  
Heavy Ions ◽  
Charge Generation ◽  
Power Mosfets

INDUCED DAMAGES IN POWER MOSFETS AFTER HEAVY IONS IRRADIATION

2010 ◽  
Author(s):  
G. BUSATTO ◽  
F. IANNUZZO ◽  
A. PORZIO ◽  
A. SANSEVERINO ◽  
F. VELARDI ◽  
...  
Keyword(s):  
Heavy Ions ◽  
Power Mosfets

Single event burnout of power MOSFETs caused by nuclear reactions with heavy ions

1994 ◽  
Vol 41 (6) ◽  
pp. 2210-2215 ◽  
Author(s):  
S. Kuboyama ◽  
S. Matsuda ◽  
T. Kanno ◽  
T. Hirose
Keyword(s):  
Heavy Ions ◽  
Nuclear Reactions ◽  
Single Event ◽  
Power Mosfets

SEB Characterization of Commercial Power MOSFETs With Backside Laser and Heavy Ions of Different Ranges

2008 ◽  
Vol 55 (4) ◽  
pp. 2166-2173 ◽  
Author(s):  
Aurore Luu ◽  
Florent Miller ◽  
Patrick Poirot ◽  
RÉmi Gaillard ◽  
Nadine Buard ◽  
...  
Keyword(s):  
Heavy Ions ◽  
Power Mosfets

Heavy ions sensitivity of power MOSFETs

1992 ◽  
Vol 39 (3) ◽  
pp. 357-361 ◽  
Author(s):  
P. Tastet ◽  
J. Garnier
Keyword(s):  
Heavy Ions ◽  
Power Mosfets

Behavior of power MOSFETs during heavy ions irradiation performed after γ-rays exposure

2012 ◽  
Vol 52 (9-10) ◽  
pp. 2363-2367 ◽  
Author(s):  
G. Busatto ◽  
V. De Luca ◽  
F. Iannuzzo ◽  
A. Sanseverino ◽  
F. Velardi
Keyword(s):  
Heavy Ions ◽  
Power Mosfets ◽  
Γ Rays

Specimen Preparation of Near Surface Ion Irradiated Samples

1985 ◽  
Vol 43 ◽  
pp. 170-171
Author(s):  
K. F. Russell ◽  
L. L. Horton
Keyword(s):  
Radiation Damage ◽  
Heavy Ions ◽  
Target Material ◽  
Metal Alloys ◽  
Specimen Surface ◽  
Specimen Preparation ◽  
Particle Accelerators ◽  
Near Surface ◽  
Graaff Accelerator ◽  
Van De Graaff

Beams of heavy ions from particle accelerators are used to produce radiation damage in metal alloys. The damaged layer extends several microns below the surface of the specimen with the maximum damage and depth dependent upon the energy of the ions, type of ions, and target material. Using 4 MeV heavy ions from a Van de Graaff accelerator causes peak damage approximately 1 μm below the specimen surface. To study this area, it is necessary to remove a thickness of approximately 1 μm of damaged metal from the surface (referred to as “sectioning“) and to electropolish this region to electron transparency from the unirradiated surface (referred to as “backthinning“). We have developed electropolishing techniques to obtain electron transparent regions at any depth below the surface of a standard TEM disk. These techniques may be applied wherever TEM information is needed at a specific subsurface position.

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