Modeling testing-strategies for yield enhancement of multichip module systems

IEEE Transactions on Reliability ◽

10.1109/24.589945 ◽

1997 ◽

Vol 46 (2) ◽

pp. 184-192

Author(s):

Sungsoo Kim ◽

N. Park ◽

P. Lombardi

Keyword(s):

Yield Enhancement ◽

Multichip Module ◽

Testing Strategies ◽

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Quality enhancement of reconfigurable multichip module systems by redundant utilization

IMTC 2001. Proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference. Rediscovering Measurement in the Age of Informatics (Cat. No.01CH 37188) ◽

10.1109/imtc.2001.928813 ◽

2002 ◽

Author(s):

M. Choi ◽

N. Park ◽

F. Lombardi ◽

V. Piuri

Keyword(s):

Multichip Module ◽

Quality Enhancement ◽

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Modelling intermediate tests for fault-tolerant multichip module systems

Microelectronics Reliability ◽

10.1016/s0026-2714(97)87776-1 ◽

1997 ◽

Vol 37 (3) ◽

pp. 530-531

Keyword(s):

Fault Tolerant ◽

Multichip Module ◽

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Multichip module yield enhancement using passive substrate fault tolerance

1996 Proceedings. Eighth Annual IEEE International Conference on Innovative Systems in Silicon ◽

10.1109/iciss.1996.552427 ◽

2002 ◽

Author(s):

C. Peacock ◽

H. Bolouri ◽

C. Habiger

Keyword(s):

Fault Tolerance ◽

Yield Enhancement ◽

Multichip Module

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Analysis of stratified testing for multichip module systems

IEEE Transactions on Reliability ◽

10.1109/24.994924 ◽

2002 ◽

Vol 51 (1) ◽

pp. 100-110 ◽

Author(s):

N. Park ◽

F. Lombardi

Keyword(s):

Multichip Module ◽

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Quality-effective repair of multichip module systems

Journal of Systems Architecture ◽

10.1016/s1383-7621(01)00038-8 ◽

2002 ◽

Vol 47 (10) ◽

pp. 883-900 ◽

Author(s):

N. Park ◽

F. Meyer ◽

F. Lombardi

Keyword(s):

Multichip Module ◽

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Quality enhancement of reconfigurable multichip module systems by redundancy utilization

IEEE Transactions on Instrumentation and Measurement ◽

10.1109/tim.2002.803305 ◽

2002 ◽

Vol 51 (4) ◽

pp. 740-749 ◽

Author(s):

Minsu Choi ◽

N. Park ◽

F. Lombardi ◽

V. Piuri

Keyword(s):

Multichip Module ◽

Quality Enhancement ◽

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Yield analysis of fault-tolerant multichip module systems for massively parallel computing

Proceedings IEEE International Conference on Wafer Scale Integration (ICWSI) ◽

10.1109/icwsi.1995.515465 ◽

2002 ◽

Author(s):

Sungsoo Kim ◽

F. Lombardi

Keyword(s):

Parallel Computing ◽

Fault Tolerant ◽

Massively Parallel ◽

Multichip Module ◽

Yield Analysis ◽

Massively Parallel Computing ◽

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Analyzing multichip module testing strategies

IEEE Design & Test of Computers ◽

10.1109/54.262321 ◽

1994 ◽

Vol 11 (1) ◽

pp. 40-52 ◽

Author(s):

M.S. Abadir ◽

A.R. Parikh ◽

P.A. Sandborn ◽

K. Drake ◽

L. Bal

Keyword(s):

Multichip Module ◽

Testing Strategies

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Modeling quality reduction of multichip module systems due to uneven fault-coverage and imperfect diagnosis

Proceedings. 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems ◽

10.1109/dftvs.1996.572022 ◽

2002 ◽

Author(s):

N. Park ◽

F. Lombardi ◽

Sungsoo Kim

Keyword(s):

Fault Coverage ◽

Multichip Module ◽

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Smart-substrate multichip-module systems

IEEE Design & Test of Computers ◽

10.1109/54.282446 ◽

1994 ◽

Vol 11 (2) ◽

pp. 64-73 ◽

Author(s):

W. Maly ◽

D.B.I. Feltham ◽

A.E. Gattiker ◽

M.D. Hobaugh ◽

K. Backus ◽

...

Keyword(s):

Multichip Module ◽

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