A novel method of measuring microelectronic interconnect transmission line parameters and discontinuity equivalent electrical parameters using multiple reflections
1996 ◽
Vol 19
(1)
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pp. 32-39
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2019 ◽
Vol 13
(17)
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pp. 3823-3835
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2011 ◽
Vol 121-126
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pp. 1269-1273
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2021 ◽
pp. 156-169
2012 ◽
Vol 43
(1)
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pp. 1376-1382
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1990 ◽
Keyword(s):
1990 ◽
Vol 37
(11)
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pp. 2361-2380
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Keyword(s):