scholarly journals Wafer Edge Yield Prediction Using a Combined Long Short-Term Memory and Feed- Forward Neural Network Model for Semiconductor Manufacturing

IEEE Access ◽  
2020 ◽  
Vol 8 ◽  
pp. 215125-215132
Author(s):  
Dasol Kim ◽  
Mintae Kim ◽  
Wooju Kim
2018 ◽  
Author(s):  
Muktabh Mayank Srivastava

We propose a simple neural network model which can learn relation between sentences by passing their representations obtained from Long Short Term Memory(LSTM) through a Relation Network. The Relation Network module tries to extract similarity between multiple contextual representations obtained from LSTM. Our model is simple to implement, light in terms of parameters and works across multiple supervised sentence comparison tasks. We show good results for the model on two sentence comparison datasets.


Author(s):  
Tanvi Bhandarkar ◽  
Vardaan K ◽  
Nikhil Satish ◽  
S. Sridhar ◽  
R. Sivakumar ◽  
...  

<p>The prediction of a natural calamity such as earthquakes has been an area of interest for a long time but accurate results in earthquake forecasting have evaded scientists, even leading some to deem it intrinsically impossible to forecast them accurately. In this paper an attempt to forecast earthquakes and trends using a data of a series of past earthquakes. A type of recurrent neural network called Long Short-Term Memory (LSTM) is used to model the sequence of earthquakes. The trained model is then used to predict the future trend of earthquakes. An ordinary Feed Forward Neural Network (FFNN) solution for the same problem was done for comparison. The LSTM neural network was found to outperform the FFNN. The R^2 score of the LSTM is better than the FFNN’s by 59%.</p>


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