A free-space measurement of complex permittivity of doped silicon wafers using transmission coefficient at microwave frequencies

2004 ◽  
Author(s):  
Noor Hasimah Baba ◽  
Zaiki Awang ◽  
Deepak K. Ghodgaonkar
Keyword(s):  
Transmission Coefficient ◽  
Complex Permittivity ◽  
Free Space ◽  
Silicon Wafers ◽  
Microwave Frequencies ◽  
Doped Silicon ◽  
Space Measurement

scholarly journals Estimation methods to extract complex permittivity from transmission coefficient in the terahertz band

2021 ◽  
Vol 53 (8) ◽  
Author(s):  
Chuang Yang ◽  
Jian Wang ◽  
Cheng Yang
Keyword(s):  
Transmission Coefficient ◽  
Iterative Algorithm ◽  
Complex Permittivity ◽  
Free Space ◽  
Estimation Methods ◽  
Extraction Technique ◽  
Initial Value ◽  
Terahertz Band ◽  
Terahertz Frequencies

AbstractIn this paper, the characteristics of the transmission coefficient (S$$_{21}$$ 21 ) measured in free-space at terahertz frequencies are analyzed. The analysis results are used to estimate the permittivity of the material under test, and the estimated permittivity is adopted as an initial-value for the iterative algorithm to extract the complex permittivity of the material from the S$$_{21}$$ 21 . The iterative extraction technique based on the estimation is efficient, while the iterative extraction technique without the estimation is inefficient. Various known materials in the literature are used to validate the technique in the terahertz band.

An improved calibration technique for free-space measurement of complex permittivity

2001 ◽  
Vol 39 (2) ◽  
pp. 453-455 ◽  
Author(s):  
M. Nakhkash ◽  
Yi Huang ◽  
W. Al-Nuaimy ◽  
M.T.C. Fang
Keyword(s):  
Complex Permittivity ◽  
Free Space ◽  
Calibration Technique ◽  
Space Measurement
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