Probe characterization and data process for current reconstruction by near field scanning method

2010 ◽  
Author(s):  
Wei Huang ◽  
Dazhao Liu ◽  
Jiang Xiao ◽  
David Pommerenke ◽  
Jin Min ◽  
...  
Keyword(s):  
Near Field ◽  
Scanning Method ◽  
Data Process ◽  
Near Field Scanning ◽  
Current Reconstruction

Near Field EMC Scanning Method Based on an E-Field Collapse

2015 ◽  
Author(s):  
Jeff Dunnihoo ◽  
Pasi Tamminen ◽  
Toni Viheriäkoski
Keyword(s):  
Near Field ◽  
Electronic Systems ◽  
Inexpensive Method ◽  
Scanning Method ◽  
Field Information ◽  
Novel Method ◽  
Near Field Scanning

Abstract In this study we present a novel method to use a field collapse method together with fully automated near field scanning equipment to construct E- and H-field information of a system during transient ESD events. This inexpensive method provides an alternative way for system designers to validate and analyze the EMC/ESD capability of electronic systems without TLP pulsers, ESD simulators, or precision inductive current probes.

Modeling Magnetic Radiations of Electronic Circuits Using Near-Field Scanning Method

2007 ◽  
Vol 49 (2) ◽  
pp. 391-400 ◽  
Author(s):  
Yolanda Vives-Gilabert ◽  
Christian Arcambal ◽  
Anne Louis ◽  
Franois de Daran ◽  
Philippe Eudeline ◽  
...  
Keyword(s):  
Near Field ◽  
Electronic Circuits ◽  
Scanning Method ◽  
Near Field Scanning

A Laboratory Investigation into the Measurement of Optical Fibre Parameters

1986 ◽  
Vol 23 (3) ◽  
pp. 197-210
Author(s):  
A. Owens
Keyword(s):  
Near Field ◽  
Numerical Aperture ◽  
Field Measurements ◽  
Refractive Index Profile ◽  
Index Profile ◽  
Scanning Method ◽  
Graded Index ◽  
The Core ◽  
Index Fibre ◽  
Near Field Scanning

An undergraduate experiment, of approximately six hours duration, is presented, in which the refractive index profile of a graded index fibre is measured using the near-field scanning method. The numerical aperture is obtained from far-field measurements and the core and cladding diameters are measured directly using an optical bench microscope and stage micrometer.

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