ADAPTIVE GENETIC ALGORITHM BASED SOURCE IDENTIFICATION WITH NEAR-FIELD SCANNING METHOD

Abstract In this study we present a novel method to use a field collapse method together with fully automated near field scanning equipment to construct E- and H-field information of a system during transient ESD events. This inexpensive method provides an alternative way for system designers to validate and analyze the EMC/ESD capability of electronic systems without TLP pulsers, ESD simulators, or precision inductive current probes.

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A genetic algorithm based method for source identification and far-field radiated emissions prediction from near-field measurements for PCB characterization

IEEE Transactions on Electromagnetic Compatibility ◽

10.1109/15.974631 ◽

2001 ◽

Vol 43 (4) ◽

pp. 520-530 ◽

Cited By ~ 98

Author(s):

J.-R. Regue ◽

M. Ribo ◽

J.-M. Garrell ◽

A. Martin

Keyword(s):

Genetic Algorithm ◽

Source Identification ◽

Near Field ◽

Field Measurements ◽

Far Field ◽

Radiated Emissions

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Wave theoretical analysis of spot excitation near-field scanning method for optical fiber index profiling: Effect of finite spot size

Radio Science ◽

10.1029/rs017i001p00187 ◽

1982 ◽

Vol 17 (1) ◽

pp. 187-195

Author(s):

M. Kitsuregawa ◽

H. Nakada ◽

T. Kamiya ◽

H. Yanai

Keyword(s):

Theoretical Analysis ◽

Optical Fiber ◽

Near Field ◽

Spot Size ◽

Scanning Method ◽

Near Field Scanning

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Modeling Magnetic Radiations of Electronic Circuits Using Near-Field Scanning Method

IEEE Transactions on Electromagnetic Compatibility ◽

10.1109/temc.2006.890168 ◽

2007 ◽

Vol 49 (2) ◽

pp. 391-400 ◽

Cited By ~ 126

Author(s):

Yolanda Vives-Gilabert ◽

Christian Arcambal ◽

Anne Louis ◽

Franois de Daran ◽

Philippe Eudeline ◽

...

Keyword(s):

Near Field ◽

Electronic Circuits ◽

Scanning Method ◽

Near Field Scanning

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Modeling the Electromagnetic Radiation of Passive Microwave Components Using a Near-Field Scanning Method

IEEE Transactions on Electromagnetic Compatibility ◽

10.1109/temc.2010.2051550 ◽

2010 ◽

Vol 52 (4) ◽

pp. 1056-1059 ◽

Cited By ~ 17

Author(s):

Abhishek Ramanujan ◽

Zouheir Riah ◽

Anne Louis ◽

Bélahcène Mazari.

Keyword(s):

Electromagnetic Radiation ◽

Near Field ◽

Passive Microwave ◽

Scanning Method ◽

Microwave Components ◽

Passive Microwave Components ◽

Near Field Scanning

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Source identification and correlation between near field-far field tolerances when applying a genetic algorithm

10.1109/emceurope.2008.4786923 ◽

2008 ◽

Cited By ~ 4

Author(s):

Hongmei Fan ◽

Franz Schlagenhaufer

Keyword(s):

Genetic Algorithm ◽

Source Identification ◽

Near Field ◽

Far Field

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Probe characterization and data process for current reconstruction by near field scanning method

2010 Asia-Pacific International Symposium on Electromagnetic Compatibility ◽

10.1109/apemc.2010.5475504 ◽

2010 ◽

Cited By ~ 4

Author(s):

Wei Huang ◽

Dazhao Liu ◽

Jiang Xiao ◽

David Pommerenke ◽

Jin Min ◽

...

Keyword(s):

Near Field ◽

Scanning Method ◽

Data Process ◽

Near Field Scanning ◽

Current Reconstruction

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A Laboratory Investigation into the Measurement of Optical Fibre Parameters

International Journal of Electrical Engineering Education ◽

10.1177/002072098602300302 ◽

1986 ◽

Vol 23 (3) ◽

pp. 197-210

Author(s):

A. Owens

Keyword(s):

Near Field ◽

Numerical Aperture ◽

Field Measurements ◽

Refractive Index Profile ◽

Index Profile ◽

Scanning Method ◽

Graded Index ◽

The Core ◽

Index Fibre ◽

Near Field Scanning

An undergraduate experiment, of approximately six hours duration, is presented, in which the refractive index profile of a graded index fibre is measured using the near-field scanning method. The numerical aperture is obtained from far-field measurements and the core and cladding diameters are measured directly using an optical bench microscope and stage micrometer.

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