2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMCCompo)
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9781538626894

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DPI immunity of bandgap in Si and SOI technologies

2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMCCompo) ◽

10.1109/emccompo.2017.7998110 ◽

2017 ◽

Cited By ~ 1

Author(s):

J. Wu ◽

H. Zhang ◽

H. Wang ◽

L. Zheng ◽

H. Ma ◽

...

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Modeling methodology of the conducted emission of a DC-DC converter board

2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMCCompo) ◽

10.1109/emccompo.2017.7998085 ◽

2017 ◽

Cited By ~ 3

Author(s):

A. Boyer ◽

M. A. Gonzalez Sentis ◽

C. Ghfiri ◽

A. Durier

Keyword(s):

Modeling Methodology ◽

Conducted Emission

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Design of an EMC test board for analog-to-digital converters

2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMCCompo) ◽

10.1109/emccompo.2017.7998112 ◽

2017 ◽

Author(s):

Michael Fuchs

Keyword(s):

Analog To Digital Converters ◽

Analog To Digital ◽

Test Board

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A time-continuous bus-feedback LIN transceiver in 0.14 µm high-voltage SOI CMOS

2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMCCompo) ◽

10.1109/emccompo.2017.7998081 ◽

2017 ◽

Cited By ~ 1

Author(s):

Matthieu Deloge ◽

Jaume Tornila Oliver ◽

Hans Brekelmans ◽

Peter Vermeeren ◽

Gert Jan Bollen ◽

...

Keyword(s):

High Voltage ◽

Soi Cmos

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Modified Kron's TAN modeling of 3D multilayer PCB

2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMCCompo) ◽

10.1109/emccompo.2017.7998116 ◽

2017 ◽

Cited By ~ 1

Author(s):

Z. Xu ◽

Y. Liu ◽

B. Ravelo ◽

O. Maurice

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Circuit modeling of the ISO 10605 field coupled electrostatic discharge test to design robust automotive integrated circuits

2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMCCompo) ◽

10.1109/emccompo.2017.7998099 ◽

2017 ◽

Author(s):

Niels Lambrecht ◽

Daniel De Zutter ◽

Dries Vande Ginste ◽

Hugo Pues

Keyword(s):

Integrated Circuits ◽

Electrostatic Discharge ◽

Circuit Modeling ◽

Discharge Test

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EMI functional vulnerability identification in RF Front-Ends

2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMCCompo) ◽

10.1109/emccompo.2017.7998074 ◽

2017 ◽

Author(s):

Alexandre Martorell ◽

Jeremy Raoult ◽

Robin Marijon ◽

Laurent Chusseau

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Measurements of EMI susceptibility of precision voltage references

2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMCCompo) ◽

10.1109/emccompo.2017.7998103 ◽

2017 ◽

Cited By ~ 2

Author(s):

A. Richelli ◽

L. Colalongo ◽

L. Toninelli ◽

I. Rusu ◽

J.-M. Redoute

Keyword(s):

Precision Voltage

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Identifying EMC-critical devices by monitoring and classifying operating region transitions

2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMCCompo) ◽

10.1109/emccompo.2017.7998073 ◽

2017 ◽

Cited By ~ 1

Author(s):

Lammert Duipmans ◽

Dusan Milosevic ◽

Arnoud van der Wel ◽

Peter Baltus

Keyword(s):

Operating Region

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An experimental investigation of four-port IC-Stripline

2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMCCompo) ◽

10.1109/emccompo.2017.7998111 ◽

2017 ◽

Author(s):

Tvrtko Mandic ◽

Renaud Gillon ◽

Adrijan Baric

Keyword(s):

Experimental Investigation

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2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMCCompo)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

DPI immunity of bandgap in Si and SOI technologies

Modeling methodology of the conducted emission of a DC-DC converter board

Design of an EMC test board for analog-to-digital converters

A time-continuous bus-feedback LIN transceiver in 0.14 µm high-voltage SOI CMOS

Modified Kron's TAN modeling of 3D multilayer PCB

Circuit modeling of the ISO 10605 field coupled electrostatic discharge test to design robust automotive integrated circuits

EMI functional vulnerability identification in RF Front-Ends

Measurements of EMI susceptibility of precision voltage references

Identifying EMC-critical devices by monitoring and classifying operating region transitions

An experimental investigation of four-port IC-Stripline

2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMCCompo)
Latest Publications