Interconnect testing using BIST embedded in IEEE 1149.1 designs

[1991] Proceedings Fourth Annual IEEE International ASIC Conference and Exhibit ◽

10.1109/asic.1991.242914 ◽

2002 ◽

Author(s):

J. Koeter ◽

S. Sparks

Keyword(s):

Interconnect Testing ◽

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A BIST TPG approach for interconnect testing with the IEEE 1149.1 STD

Proceedings Eighth Asian Test Symposium (ATS'99) ◽

10.1109/ats.1999.810735 ◽

2003 ◽

Author(s):

W. Feng ◽

W.K. Huang ◽

F.J. Meyer ◽

F. Lombardi

Keyword(s):

Interconnect Testing ◽

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Development of Cloud Service for Interconnect Testing on HEMS Devices

IEEJ Transactions on Electronics Information and Systems ◽

10.1541/ieejeiss.133.818 ◽

2013 ◽

Vol 133 (4) ◽

pp. 818-819

Author(s):

Hiroshi Sugimura ◽

Kazuo Sekiya ◽

Tomoki Watanabe ◽

Masao Isshiki

Keyword(s):

Cloud Service ◽

Interconnect Testing

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A user programmable macrocell generator for the IEEE 1149.1 boundary scan standard interface port

Microprocessing and Microprogramming ◽

10.1016/0165-6074(92)90359-f ◽

1992 ◽

Vol 35 (1-5) ◽

pp. 493-500

Author(s):

Mark Royals ◽

Tassos Markas ◽

Nick Kanopoulos

Keyword(s):

Boundary Scan ◽

Standard Interface ◽

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Toshiba IEEE 1149.1 (JTAG) development summary

[1991] Proceedings Fourth Annual IEEE International ASIC Conference and Exhibit ◽

10.1109/asic.1991.242915 ◽

2002 ◽

Author(s):

J. Thomas

Keyword(s):

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Interconnect Testing for Networks on Chips

24th IEEE VLSI Test Symposium ◽

10.1109/vts.2006.41 ◽

2006 ◽

Author(s):

K. Stewart ◽

S. Tragoudas

Keyword(s):

Interconnect Testing ◽

Networks On Chips

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FPGA test time reduction through a novel interconnect testing scheme

Proceedings of the 2002 ACM/SIGDA tenth international symposium on Field-programmable gate arrays - FPGA '02 ◽

10.1145/503048.503069 ◽

2002 ◽

Author(s):

Stuart McCracken ◽

Zeljko Zilic

Keyword(s):

Test Time ◽

Interconnect Testing ◽

Testing Scheme ◽

Test Time Reduction ◽

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Integration of IEEE 1149.1 with mixed ECL, TTL and differential logic signals

Proceedings ETC 93 Third European Test Conference ◽

10.1109/etc.1993.246575 ◽

2002 ◽

Author(s):

J. Andrews

Keyword(s):

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Adapting jtag for ac interconnect testing

International Test Conference, 2003. Proceedings. ITC 2003. ◽

10.1109/test.2003.1270892 ◽

2004 ◽

Author(s):

L. Whetsel

Keyword(s):

Interconnect Testing

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Core interconnect testing hazards

Proceedings Design, Automation and Test in Europe ◽

10.1109/date.1998.655985 ◽

2002 ◽

Author(s):

P. Nordholz ◽

H. Grabinski ◽

D. Treytnar ◽

J. Otterstedt ◽

D. Niggemeyer ◽

...

Keyword(s):

Interconnect Testing

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An implementation of IEEE 1149.1 to avoid timing violations and other practical in-compliance improvements

Proceedings. International Test Conference ◽

10.1109/test.2002.1041827 ◽

2003 ◽

Author(s):

D. Stang ◽

R. Dandapani

Keyword(s):

Ieee 1149.1 ◽

Timing Violations

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