Proceedings Eighth Asian Test Symposium (ATS'99)
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61

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9

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Published By IEEE Comput. Soc

0769503152

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Accelerating test data processing

Proceedings Eighth Asian Test Symposium (ATS'99) ◽

10.1109/ats.1999.810738 ◽

2003 ◽

Author(s):

S. Demidenko ◽

K. Lever

Keyword(s):

Data Processing ◽

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March tests for word-oriented two-port memories

Proceedings Eighth Asian Test Symposium (ATS'99) ◽

10.1109/ats.1999.810729 ◽

2003 ◽

Author(s):

S. Hamdioui ◽

A.J. van de Goor

Keyword(s):

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How to design an environment simulator for safety critical software testing

Proceedings Eighth Asian Test Symposium (ATS'99) ◽

10.1109/ats.1999.810760 ◽

2003 ◽

Author(s):

Haiying Tu ◽

Fangmei Wu

Keyword(s):

Software Testing ◽

Safety Critical

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Research and implementation of a high speed test generation for ultra large scale combinational circuits

Proceedings Eighth Asian Test Symposium (ATS'99) ◽

10.1109/ats.1999.810731 ◽

2003 ◽

Author(s):

Zhide Zeng ◽

Jihua Chen ◽

Hefeng Cao

Keyword(s):

Test Generation ◽

Large Scale ◽

Combinational Circuits ◽

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Minimizing the number of test configurations for different FPGA families

Proceedings Eighth Asian Test Symposium (ATS'99) ◽

10.1109/ats.1999.810776 ◽

2003 ◽

Author(s):

M. Renovell ◽

J.M. Portal ◽

J. Figuras ◽

Y. Zorian

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High resolution CD-SEM system

Proceedings Eighth Asian Test Symposium (ATS'99) ◽

10.1109/ats.1999.810779 ◽

2003 ◽

Author(s):

Y. Ose ◽

M. Ezumi ◽

H. Todokoro

Keyword(s):

High Resolution

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On an effective selection of IDDQ measurement vectors for sequential circuits

Proceedings Eighth Asian Test Symposium (ATS'99) ◽

10.1109/ats.1999.810743 ◽

2003 ◽

Author(s):

H. Ichihara ◽

K. Kinoshita ◽

S. Kajihara

Keyword(s):

Sequential Circuits ◽

Effective Selection ◽

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Scenario based integration testing for object-oriented software development

Proceedings Eighth Asian Test Symposium (ATS'99) ◽

10.1109/ats.1999.810764 ◽

2003 ◽

Author(s):

Youngchul Kim ◽

C.R. Carlson

Keyword(s):

Software Development ◽

Object Oriented ◽

Integration Testing

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Procedure to overcome the Byzantine General's problem for bridging faults in CMOS circuits

Proceedings Eighth Asian Test Symposium (ATS'99) ◽

10.1109/ats.1999.810739 ◽

2003 ◽

Author(s):

A. Keshk ◽

Y. Miura ◽

K. Kinoshita

Keyword(s):

Cmos Circuits ◽

Bridging Faults

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Identification of redundant crosspoint faults in sequential PLAs with fault-free hardware reset

Proceedings Eighth Asian Test Symposium (ATS'99) ◽

10.1109/ats.1999.810762 ◽

2003 ◽

Author(s):

T. Yamada ◽

T. Kotake ◽

H. Takahashi ◽

K. Yamazaki

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