International Test Conference, 2003. Proceedings. ITC 2003.
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223

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0780381068

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Adapting jtag for ac interconnect testing

International Test Conference, 2003. Proceedings. ITC 2003. ◽

10.1109/test.2003.1270892 ◽

2004 ◽

Author(s):

L. Whetsel

Keyword(s):

Interconnect Testing

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On reducing wrapper boundary register cells in modular soc testing

International Test Conference, 2003. Proceedings. ITC 2003. ◽

10.1109/test.2003.1270889 ◽

2004 ◽

Author(s):

Qiang Xu ◽

N. Nicolici

Keyword(s):

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Analog circuit test using transfer function coefficient estimates

International Test Conference, 2003. Proceedings. ITC 2003. ◽

10.1109/test.2003.1271104 ◽

2004 ◽

Author(s):

Zhen Guo ◽

J. Savir

Keyword(s):

Transfer Function ◽

Analog Circuit ◽

Coefficient Estimates ◽

Function Coefficient

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Modeling scan chain modifications for scan-in test power minimization

International Test Conference, 2003. Proceedings. ITC 2003. ◽

10.1109/test.2003.1270887 ◽

2004 ◽

Author(s):

O. Sinanoglu ◽

A. Orailoglu

Keyword(s):

Power Minimization ◽

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Bist for minx 4000 and spartan series fpgas: a case study

International Test Conference, 2003. Proceedings. ITC 2003. ◽

10.1109/test.2003.1271115 ◽

2004 ◽

Author(s):

C.E. Stroud ◽

K.N. Leach ◽

T.A. Slaughter

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DFFT design for functional testability

International Test Conference, 2003. Proceedings. ITC 2003. ◽

10.1109/test.2003.1271099 ◽

2004 ◽

Author(s):

H. Konuk ◽

L. Mao

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IBIST/sup TM/ (interconnect built-in self-test) architecture and methodology for pci express: intel's next-generation test and validation methodology for performance IO

International Test Conference, 2003. Proceedings. ITC 2003. ◽

10.1109/test.2003.1270909 ◽

2004 ◽

Author(s):

J.J. Nejedlo

Keyword(s):

Next Generation ◽

Pci Express ◽

Self Test ◽

Built In Self Test ◽

Test Architecture ◽

Generation Test

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Structural delay testing of latch-based high-speed pipelines with time borrowing

International Test Conference, 2003. Proceedings. ITC 2003. ◽

10.1109/test.2003.1271097 ◽

2004 ◽

Author(s):

Kun Young Chung ◽

S.K. Gupta

Keyword(s):

Delay Testing ◽

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Latch divergency in microprocessor failure analysis

International Test Conference, 2003. Proceedings. ITC 2003. ◽

10.1109/test.2003.1270905 ◽

2004 ◽

Author(s):

P. Dahlgren ◽

P. Dickinson ◽

I. Parulkar

Keyword(s):

Failure Analysis

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Convolutional compaction of test responses

International Test Conference, 2003. Proceedings. ITC 2003. ◽

10.1109/test.2003.1270904 ◽

2004 ◽

Author(s):

J. Rajski ◽

J. Tyszer ◽

Chen Wang ◽

S.M. Reddy

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