Variation-Aware Fault Grading

2012 IEEE 21st Asian Test Symposium ◽

10.1109/ats.2012.14 ◽

2012 ◽

Author(s):

A. Czutro ◽

M.E. Imhof ◽

J. Jiang ◽

A. Mumtaz ◽

M. Sauer ◽

...

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Fault Grading Techniques of Software Test Libraries for Safety-Critical Applications

IEEE Access ◽

10.1109/access.2019.2917036 ◽

2019 ◽

Vol 7 ◽

pp. 63578-63587 ◽

Author(s):

Andrea Floridia ◽

Ernesto Sanchez ◽

Matteo Sonza Reorda

Keyword(s):

Software Test ◽

Safety Critical ◽

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Techniques for Fast Transient Fault Grading Based on Autonomous Emulation

10.1109/date.2005.302 ◽

2005 ◽

Author(s):

C. Lopez-Ongil ◽

M. Garcia-Valderas ◽

M. Portela-Garcia ◽

L. Entrena-Arrontes

Keyword(s):

Transient Fault ◽

Fast Transient ◽

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Accelerated Fault Simulation and Fault Grading in Combinational Circuits

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.1987.1270316 ◽

1987 ◽

Vol 6 (5) ◽

pp. 704-712 ◽

Author(s):

K.J. Antreich ◽

M.H. Schulz

Keyword(s):

Fault Simulation ◽

Combinational Circuits ◽

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100% VLSI Fault Grading Is No Longer an Imaginary Goal. It's a Reality

IEEE Design & Test of Computers ◽

10.1109/mdt.1985.294728 ◽

1985 ◽

Vol 2 (3) ◽

pp. 7-7

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Improving gate level fault coverage by RTL fault grading

Proceedings International Test Conference 1996. Test and Design Validity ◽

10.1109/test.1996.556957 ◽

2002 ◽

Author(s):

Weiwei Mao ◽

R.K. Gulati

Keyword(s):

Fault Coverage ◽

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Fault grading using Instruction-Execution graph

2010 East-West Design & Test Symposium (EWDTS) ◽

10.1109/ewdts.2010.5742054 ◽

2010 ◽

Author(s):

K. R. Vinutha ◽

Virendra Singh ◽

Anzhela Matrosova ◽

M. S. Gaur

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A novel critical path heuristic for fast fault grading

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.75639 ◽

1991 ◽

Vol 10 (4) ◽

pp. 544-548 ◽

Author(s):

M. Favalli ◽

P. Olivo ◽

B. Ricco

Keyword(s):

Critical Path ◽

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Fault emulation: A new methodology for fault grading

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.790625 ◽

1999 ◽

Vol 18 (10) ◽

pp. 1487-1495 ◽

Author(s):

Kwang-Ting Cheng ◽

Shi-Yu Huang ◽

Wei-Jin Dai

Keyword(s):

Fault Grading ◽

Fault Emulation

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Fault grading, a measure of logic simulation integrity

10.1109/asic.1989.123222 ◽

2003 ◽

Author(s):

L. Greggain ◽

B. White

Keyword(s):

Logic Simulation ◽

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A Fault Grading Methodology for Software-Based Self-Test Programs in Systems-on-Chip

2010 11th International Workshop on Microprocessor Test and Verification ◽

10.1109/mtv.2010.16 ◽

2010 ◽

Author(s):

O. Ballan ◽

P. Bernardi ◽

G. Fontana ◽

M. Grosso ◽

E. Sanchez

Keyword(s):

Systems On Chip ◽

Self Test ◽

On Chip ◽

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